{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T21:45:46Z","timestamp":1774043146243,"version":"3.50.1"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2022YFB2502701"],"award-info":[{"award-number":["2022YFB2502701"]}]},{"name":"Scientific Research Foundation of Jiangsu Province, China","award":["BE2022032-1"],"award-info":[{"award-number":["BE2022032-1"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tie.2025.3632483","type":"journal-article","created":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T18:58:35Z","timestamp":1766170715000},"page":"5174-5185","source":"Crossref","is-referenced-by-count":0,"title":["Influence of PWM Excitation on Loss and Temperature of Flat Wire Permanent Magnet Machines for Electric Vehicles"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4854-0263","authenticated-orcid":false,"given":"Zhongze","family":"Wu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2119-6835","authenticated-orcid":false,"given":"Xueyi","family":"Yan","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3614-2821","authenticated-orcid":false,"given":"Zhimian","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1438-9056","authenticated-orcid":false,"given":"Wentao","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2047-9712","authenticated-orcid":false,"given":"Wei","family":"Hua","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3149786"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2008.2001527"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2700473"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2025.3583649"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2030206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2024.3496759"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.871439"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2016.2566924"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011622"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/ip-b.1991.0025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2278866"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.30941\/CESTEMS.2025.00001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3478056"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.926233"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733499"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2522942"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3067601"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2942563"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2025.3543400"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3314004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3179571"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3094833"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3275742"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/28.936396"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.917067"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3183338"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2895887"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2844312"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3065626"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS59686.2023.10345379"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICEM51905.2022.9910892"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2025.3532407"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2100337"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3253170"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3075844"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.922604"},{"key":"ref37","volume-title":"Heat Transfer","author":"Mills","year":"1999"},{"key":"ref38","first-page":"359","article-title":"New equations for heat and mass transfer in turbulent pipe and channel flow","volume":"16","author":"Gnielinski","year":"1976","journal-title":"Int. Chem. Eng."},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1115\/1.2910635"},{"key":"ref40","volume-title":"Introduction to Heat Transfer","author":"Incropera","year":"1990"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2407864"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC60492.2025.11061091"},{"key":"ref43","article-title":"ANSYS Electronics 2021 R1.","year":"2022"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/20.996313"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2636203"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2530304"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2025.3552424"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2573267"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11447357\/11304737.pdf?arnumber=11304737","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T19:58:52Z","timestamp":1774036732000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11304737\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":48,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3632483","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}