{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T21:04:47Z","timestamp":1774299887967,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Zhejiang Provincial Natural Science Foundation of China","award":["LQN25F030027"],"award-info":[{"award-number":["LQN25F030027"]}]},{"name":"Zhejiang Provincial Natural Science Foundation of China","award":["LQ23F030009"],"award-info":[{"award-number":["LQ23F030009"]}]},{"name":"Open Research Project of the State Key Laboratory of Industrial Control Technology, China","award":["ICT2025B43"],"award-info":[{"award-number":["ICT2025B43"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["NSFC:62173297"],"award-info":[{"award-number":["NSFC:62173297"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["NSFC:62203035"],"award-info":[{"award-number":["NSFC:62203035"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Zhejiang Key Research and Development Program","award":["2022C01035"],"award-info":[{"award-number":["2022C01035"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tie.2025.3637408","type":"journal-article","created":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T18:58:35Z","timestamp":1766170715000},"page":"6405-6416","source":"Crossref","is-referenced-by-count":0,"title":["Robust Tracking With Disturbance Rejection Control of DC\u2013DC Converters via Internal Model-Based Approach"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7380-0397","authenticated-orcid":false,"given":"Mengting","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2150-5548","authenticated-orcid":false,"given":"Zhitao","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6781-7607","authenticated-orcid":false,"given":"Jiawang","family":"Yue","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2397-3334","authenticated-orcid":false,"given":"Zhenbing","family":"Qiu","sequence":"additional","affiliation":[{"name":"School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4914-4457","authenticated-orcid":false,"given":"Jianfeng","family":"Liao","sequence":"additional","affiliation":[{"name":"AgiBot, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1986-8893","authenticated-orcid":false,"given":"Chenhuan","family":"Cui","sequence":"additional","affiliation":[{"name":"School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7003-1000","authenticated-orcid":false,"given":"Hongye","family":"Su","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Institute of Cyber-Systems and Control, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3347736"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12071581"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3007739"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3283975"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3217612"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3073643"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3047754"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3026301"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3216600"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3264536"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3198249"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3355459"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3333040"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2023.3313056"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2025.106250"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3432571"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3314907"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3352158"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(76)90006-6"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/9.940923"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2004.839236"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110418"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2935248"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3163536"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2927177"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3308131"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10311649"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/9783527626014"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0011-9"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3121754"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11447357\/11304607.pdf?arnumber=11304607","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T20:07:50Z","timestamp":1774296470000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11304607\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":30,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3637408","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}