{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T04:18:05Z","timestamp":1777954685365,"version":"3.51.4"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Shenzhen Science and Technology Program","award":["JCYJ20250604175412017"],"award-info":[{"award-number":["JCYJ20250604175412017"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473387"],"award-info":[{"award-number":["62473387"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Southern Marine Science and Engineering Guangdong Laboratory","award":["SML2024SP007"],"award-info":[{"award-number":["SML2024SP007"]}]},{"DOI":"10.13039\/501100007162","name":"Guangdong Provincial Department of Science and Technology","doi-asserted-by":"publisher","award":["2021QN020085"],"award-info":[{"award-number":["2021QN020085"]}],"id":[{"id":"10.13039\/501100007162","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tie.2025.3647803","type":"journal-article","created":{"date-parts":[[2026,1,16]],"date-time":"2026-01-16T20:50:00Z","timestamp":1768596600000},"page":"8185-8196","source":"Crossref","is-referenced-by-count":0,"title":["Phase Current Magnitude Adaptive Fault Tolerant Control of Dual Three-Phase Interior PMSMs Under Open-Phase Fault"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4986-8586","authenticated-orcid":false,"given":"Guodong","family":"Feng","sequence":"first","affiliation":[{"name":"School of Intelligent Systems Engineering, Shenzhen Campus of Sun Yat-sen University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8418-7526","authenticated-orcid":false,"given":"Yuting","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Intelligent Systems Engineering, Shenzhen Campus of Sun Yat-sen University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2418-2676","authenticated-orcid":false,"given":"Zhe","family":"Tong","sequence":"additional","affiliation":[{"name":"School of Intelligent Systems Engineering, Shenzhen Campus of Sun Yat-sen University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0545-547X","authenticated-orcid":false,"given":"Chunyan","family":"Lai","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Concordia University, Montreal, QC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5771-1204","authenticated-orcid":false,"given":"Beichen","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Advanced Manufacturing, Shenzhen Campus of Sun Yat-sen University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/machines10030221"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3370622"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2883665"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3180153"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3312431"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3476965"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3239632"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3084172"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3199100"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2982324"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3142404"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3199100"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880698"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3210039"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2900599"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3222224"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3280172"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2559498"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3019391"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3032668"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3323570"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3195526"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3223411"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3199229"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944056"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2915666"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3270428"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3340871"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3076509"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2830507"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3299965"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823684"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2703682"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2854550"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3288525"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3484584"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3452191"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3449323"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3406852"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2024.3397637"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3454474"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3116553"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3222661"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876607"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3172389"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2620426"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3091468"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2632118"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11503074\/11355851.pdf?arnumber=11355851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T19:36:03Z","timestamp":1777923363000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11355851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":48,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3647803","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}