{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T04:18:05Z","timestamp":1777954685426,"version":"3.51.4"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52477198"],"award-info":[{"award-number":["52477198"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52407224"],"award-info":[{"award-number":["52407224"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tie.2026.3651405","type":"journal-article","created":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T21:01:37Z","timestamp":1769115697000},"page":"8494-8505","source":"Crossref","is-referenced-by-count":0,"title":["An Improved Integrated Transformer With Lower Eddy Loss for Combined OBC and LDC System"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6658-9602","authenticated-orcid":false,"given":"Chenli","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8453-8777","authenticated-orcid":false,"given":"Jianping","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2861-8876","authenticated-orcid":false,"given":"Rui","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-6109-4821","authenticated-orcid":false,"given":"Xia","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2623-3606","authenticated-orcid":false,"given":"Haibin","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2897050"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2212917"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3319996"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3289965"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3367874"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3190968"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2555622"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3429579"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3459915"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3148730"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3331033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3327119"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APEC39645.2020.9124521"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2881276"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2774440"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2025.3600424"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3116574"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3095491"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2874806"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3313960"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2907686"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2023.3294233"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3298894"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674599"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.23919\/EPE23ECCEEurope58414.2023.10264329"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3333820"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2070519"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3378278"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11503074\/11361232.pdf?arnumber=11361232","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T19:36:01Z","timestamp":1777923361000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11361232\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":28,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3651405","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}