{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T23:10:41Z","timestamp":1792797041629,"version":"4.5.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry & Energy (MOTIE) of the Republic of Korea","award":["RS-2025-02413014"],"award-info":[{"award-number":["RS-2025-02413014"]}],"id":[{"id":"https:\/\/ror.org\/02zq38y32","id-type":"ROR","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,7]]},"DOI":"10.1109\/tie.2026.3654844","type":"journal-article","created":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T20:49:45Z","timestamp":1770410985000},"page":"9557-9568","source":"Crossref","is-referenced-by-count":2,"title":["Dynamic Adjustment-Based SPWM Control for Neutral-Point Voltage Balance in NPC Three-Level Inverters"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-1068-7335","authenticated-orcid":false,"given":"Ancheng","family":"Liu","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Chonnam National University, Gwangju, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0348-1954","authenticated-orcid":false,"given":"Da-Hyun","family":"Son","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Chonnam National University, Gwangju, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8337-2333","authenticated-orcid":false,"given":"Sung-Jun","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Chonnam National University, Gwangju, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3343-1889","authenticated-orcid":false,"given":"Guangyao","family":"Li","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology Zhengzhou Research Institute, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2961385"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3161809"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2899564"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3085798"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3106339"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3047952"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3321999"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3389692"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3075562"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3074957"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3312445"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3375348"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3177795"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3032124"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2942540"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3184757"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2984698"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3030275"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2962907"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3103159"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3151621"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3520603"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3186927"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3511081"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3107618"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3111844"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3176271"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3012726"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3084914"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3368164"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3302470"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2930570"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2392106"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11547310\/11373415.pdf?arnumber=11373415","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T19:40:42Z","timestamp":1780515642000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11373415\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7]]},"references-count":33,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3654844","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7]]}}}