{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:37:18Z","timestamp":1782373038463,"version":"3.54.5"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T00:00:00Z","timestamp":1782864000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52577187"],"award-info":[{"award-number":["52577187"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,7]]},"DOI":"10.1109\/tie.2026.3658668","type":"journal-article","created":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T21:07:00Z","timestamp":1771276020000},"page":"10058-10070","source":"Crossref","is-referenced-by-count":1,"title":["A High-Voltage-Gain Three-Port DC\u2013DC Converter With Reduced Semiconductor Stress and Low Input Current Ripple"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-7403-0731","authenticated-orcid":false,"given":"Xianjun","family":"Chen","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7450-7873","authenticated-orcid":false,"given":"Mingzhu","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6183-5232","authenticated-orcid":false,"given":"Peiyao","family":"Rao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7210-5811","authenticated-orcid":false,"given":"Ronghuan","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1005-2387","authenticated-orcid":false,"given":"Yang","family":"Yi","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3212-9821","authenticated-orcid":false,"given":"Yizhan","family":"Zhuang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9902-4664","authenticated-orcid":false,"given":"Yiming","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/OJIA.2025.3555529"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2025.3561767"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3576476"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3570190"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3595594"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2025.3565215"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3586151"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3585117"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3046453"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3131505"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3060614"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3568492"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2025.3582684"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICJECE.2025.3582062"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3287974"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2025.3561627"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3584048"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3573936"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3568608"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3556421"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3579261"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/15567036.2023.2184003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3280195"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.04.017"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2791840"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944068"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3374095"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3220909"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3047038"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3022538"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3017619"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11547310\/11397133.pdf?arnumber=11397133","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T19:55:49Z","timestamp":1780602949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11397133\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,7]]},"references-count":31,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3658668","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,7]]}}}