{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,29]],"date-time":"2026-06-29T19:52:09Z","timestamp":1782762729297,"version":"3.54.5"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of Ministry of Science and Technology","award":["2023YFD2100305"],"award-info":[{"award-number":["2023YFD2100305"]}]},{"name":"Fundamental Research Foundation of National Key laboratory of Automatic Target Recognition","award":["WDZC20255290210"],"award-info":[{"award-number":["WDZC20255290210"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62204082"],"award-info":[{"award-number":["62204082"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62474059"],"award-info":[{"award-number":["62474059"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62474060"],"award-info":[{"award-number":["62474060"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004735","name":"Natural Science Foundation of Hunan Province","doi-asserted-by":"publisher","award":["2023TT20017"],"award-info":[{"award-number":["2023TT20017"]}],"id":[{"id":"10.13039\/501100004735","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Huxiang Young Talents Program","award":["2023RC3105"],"award-info":[{"award-number":["2023RC3105"]}]},{"name":"Huxiang Young Talents Program","award":["2024RC3075"],"award-info":[{"award-number":["2024RC3075"]}]},{"name":"Project of Yuelushan Center for Industrial Innovation","award":["2025YCII0109"],"award-info":[{"award-number":["2025YCII0109"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tie.2026.3658673","type":"journal-article","created":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T20:52:24Z","timestamp":1772571144000},"page":"11451-11462","source":"Crossref","is-referenced-by-count":0,"title":["Tribo-Elevator: Boosting the Power Efficiency of Hybrid Energy Harvesting System"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-0261-6255","authenticated-orcid":false,"given":"Zihao","family":"Yang","sequence":"first","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-5191-5269","authenticated-orcid":false,"given":"Changming","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-8599-5577","authenticated-orcid":false,"given":"Haoyu","family":"Mou","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-7589-0031","authenticated-orcid":false,"given":"Bin","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-2673-3773","authenticated-orcid":false,"given":"Yuxuan","family":"Liang","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6239-8431","authenticated-orcid":false,"given":"Haojiang","family":"Wen","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-7204-1407","authenticated-orcid":false,"given":"Chi","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7013-1442","authenticated-orcid":false,"given":"She","family":"Chen","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3440-9555","authenticated-orcid":false,"given":"Lei","family":"Shan","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1325-2410","authenticated-orcid":false,"given":"Lei","family":"Liao","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3076-4776","authenticated-orcid":false,"given":"Sixing","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2017.06.035"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.2c12458"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s43586-023-00220-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2197239"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2585304"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2009.4977426"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3042753"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067389"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3220848"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454538"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2017.05.027"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6439\/abb754"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2342721"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2934985"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3001814"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2476379"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2844358"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7418060"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2778279"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3025722"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2917549"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2926047"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2016.03.004"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3325312"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3405900"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3169733"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-024-01236-7"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2023.117774"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/en18081970"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665X\/aa8a09"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2900574"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11577665\/11420242.pdf?arnumber=11420242","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,29]],"date-time":"2026-06-29T19:40:19Z","timestamp":1782762019000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11420242\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":31,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3658673","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}