{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:47:39Z","timestamp":1782373659297,"version":"3.54.5"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tie.2026.3666028","type":"journal-article","created":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T20:15:33Z","timestamp":1773692133000},"page":"11151-11162","source":"Crossref","is-referenced-by-count":0,"title":["Design and Analysis of Amorphous-Alloy Axial Flux-Switching Permanent-Magnet Machine Considering Degradation Effect"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2041-9792","authenticated-orcid":false,"given":"Yiwei","family":"Wang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Intelligent Power Distribution Equipment, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6961-7437","authenticated-orcid":false,"given":"Peng","family":"Su","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Power Distribution Equipment, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2047-9712","authenticated-orcid":false,"given":"Wei","family":"Hua","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2029-403X","authenticated-orcid":false,"given":"Yongjian","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Intelligent Power Distribution Equipment, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2023.3287558"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3078338"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2024.3441589"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2779413"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3503590"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931282"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3312992"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3065336"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3111498"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3018255"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2905806"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3033262"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3007885"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2025.3548722"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2807418"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ITECAsia-Pacific56316.2022.9941935"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3129272"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3385648"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2025412"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2013.6556166"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2940918"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2023.3305017"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2817178"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11577665\/11435233.pdf?arnumber=11435233","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:01:10Z","timestamp":1782370870000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11435233\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":23,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3666028","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}