{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:47:43Z","timestamp":1782373663249,"version":"3.54.5"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["52425701"],"award-info":[{"award-number":["52425701"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"National Key Laboratory of Electromagnetic Energy","award":["614221725010102"],"award-info":[{"award-number":["614221725010102"]}]},{"name":"National Key Laboratory of Electromagnetic Energy","award":["614221724010101"],"award-info":[{"award-number":["614221724010101"]}]},{"name":"Science and Technology Innovation Leading Talent Program of Henan Province","award":["254200510009"],"award-info":[{"award-number":["254200510009"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tie.2026.3670237","type":"journal-article","created":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T20:07:08Z","timestamp":1773950828000},"page":"12414-12426","source":"Crossref","is-referenced-by-count":0,"title":["Data Augmentation by Time-Frequency Feature Reconstruction for Few-Shot Multifault Diagnosis of PMSM"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-6323-0425","authenticated-orcid":false,"given":"Ke","family":"Lv","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6442-9082","authenticated-orcid":false,"given":"Qiang","family":"Wang","sequence":"additional","affiliation":[{"name":"XJ Electric Science and Technology Research Institute, XJ Electric Company Ltd., Xuchang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5298-4142","authenticated-orcid":false,"given":"Dong","family":"Wang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5946-8407","authenticated-orcid":false,"given":"Zhiqiang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2559-1252","authenticated-orcid":false,"given":"Jikai","family":"Si","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhengzhou University, Zhengzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9690-9432","authenticated-orcid":false,"given":"Jinghua","family":"Hu","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Electromagnetic Energy, Naval University of Engineering, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823698"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3201156"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3312431"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2963295"},{"issue":"8","key":"ref5","first-page":"8559","article-title":"A review of fault diagnosis and online condition monitoring of stator insulation in AC electrical machine","volume-title":"Proc. CSEE","volume":"35","author":"Zheng","year":"2020"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2012812"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3383037"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3093503"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3092198"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2886772"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3058541"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3209166"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2895132"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3007441"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3231304"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2941868"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3120975"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2023.3334866"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3349616"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3229274"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3211203"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3366991"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11577665\/11448097.pdf?arnumber=11448097","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:01:18Z","timestamp":1782370878000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11448097\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":22,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3670237","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}