{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:47:44Z","timestamp":1782373664421,"version":"3.54.5"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,8,1]],"date-time":"2026-08-01T00:00:00Z","timestamp":1785542400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry and Energy (MOTIE) of the Republic of Korea","award":["RS-2023-00266248"],"award-info":[{"award-number":["RS-2023-00266248"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,8]]},"DOI":"10.1109\/tie.2026.3672764","type":"journal-article","created":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T19:48:17Z","timestamp":1774381697000},"page":"12452-12463","source":"Crossref","is-referenced-by-count":1,"title":["An Online Condition Monitoring Method for DC-Link Capacitors of Three-Level NPC Inverters Based on Charge\u2013Discharge Profile"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-1758-2370","authenticated-orcid":false,"given":"Kyu-Jin","family":"Min","sequence":"first","affiliation":[{"name":"Department of Smart ICT Convergence Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6164-3208","authenticated-orcid":false,"given":"Ui-Min","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Smart ICT Convergence Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[{"name":"AAU Energy, Aalborg University, Aalborg, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3305153"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3055164"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2252958"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/APEC43599.2022.9773594"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3547374"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3359231"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2025.3546654"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2845889"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3023469"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.802922"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2308357"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674598"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/2943.974353"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2218561"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3092429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3454814"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3128021"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2904551"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3042218"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3217587"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3442077"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3327529"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3163012"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2964068"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2025.125159"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3283714"},{"key":"ref27","first-page":"1","article-title":"A model-based prognostics methodology for electrolytic capacitors based on electrical overstress accelerated aging","volume-title":"Proc. Annu. Conf. Prognostics Health Manage. Soc.","author":"Celaya","year":"2011"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2016.7793614"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11577665\/11455496.pdf?arnumber=11455496","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T07:01:24Z","timestamp":1782370884000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11455496\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8]]},"references-count":28,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3672764","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8]]}}}