{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T19:59:15Z","timestamp":1785182355050,"version":"3.55.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,9]]},"DOI":"10.1109\/tie.2026.3675229","type":"journal-article","created":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T19:53:05Z","timestamp":1776455585000},"page":"13166-13175","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive Quantum-Based Least Mean Fourth Control for Multisource Isolated Three-Phase Microgrids: Experimental Analysis and Performance Evaluation"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6848-3721","authenticated-orcid":false,"given":"Sombir","family":"Kundu","sequence":"first","affiliation":[{"name":"Maharishi Markandeshwar (Deemed to be University)","place":["Haryana, India"],"department":["EE Department"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0725-1198","authenticated-orcid":false,"given":"Ashutosh K.","family":"Giri","sequence":"additional","affiliation":[{"name":"Government Engineering College","place":["Gujarat, India"],"department":["EE Department"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4419-4516","authenticated-orcid":false,"given":"Dipankar","family":"Deb","sequence":"additional","affiliation":[{"name":"IIT Mandi","place":["Himachal Pradesh, India"],"department":["Centre for AI and Robotics"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4307-3413","authenticated-orcid":false,"given":"Rajeev Kumar","family":"Singh","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology (Banaras Hindu University)","place":["Uttar Pradesh, India"],"department":["EE Department"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2023.3306741"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/15567036.2022.2143943"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5936"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jsyst.2018.2828838"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2018.2793213"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2020.3029125"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2711571"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsyst.2019.2949083"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2018.03.086"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/appeec.2013.6837211"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/jnm.3082"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2022.3170003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/iccpct.2017.8074291"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2023.2239222"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2019.01.029"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2016.2565642"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2903748"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2019.2923575"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2018.8332112"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/eeccis49483.2020.9263476"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2016.0089"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/pedes.2016.7914481"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/odicon50556.2021.9428970"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3125743"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/jsyst.2023.3241346"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/upcon.2018.8597005"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.0776"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2024.3516878"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11623363\/11482862.pdf?arnumber=11482862","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T19:01:18Z","timestamp":1785178878000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11482862\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9]]},"references-count":28,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2026.3675229","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9]]}}}