{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T09:22:09Z","timestamp":1742635329896},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2010,12,1]],"date-time":"2010-12-01T00:00:00Z","timestamp":1291161600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/tifs.2010.2058105","type":"journal-article","created":{"date-parts":[[2010,7,21]],"date-time":"2010-07-21T19:27:10Z","timestamp":1279740430000},"page":"955-964","source":"Crossref","is-referenced-by-count":8,"title":["Asymptotic Biometric Analysis for Large Gallery Sizes"],"prefix":"10.1109","volume":"5","author":[{"given":"M","family":"Baveja","sequence":"first","affiliation":[]},{"family":"Hongsong Yuan","sequence":"additional","affiliation":[]},{"given":"L M","family":"Wein","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2004.1315146"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0407496102"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-5449-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-75953-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1060.0375"},{"key":"ref15","volume":"12","author":"johnson","year":"1995","journal-title":"Continuous Univariate Distributions"},{"key":"ref16","author":"weisstein","year":"0","journal-title":"Extreme Value Distribution"},{"key":"ref17","author":"abramowitz","year":"1964","journal-title":"Handbook of Mathematical Functions with Formulas Graphs and Mathematical Tables"},{"key":"ref18","article-title":"Matching performance for the US-VISIT IDENT system using flat fingerprints","author":"wilson","year":"2004","journal-title":"National Institute of Standards and Technology Internal Report 7110"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1032374241"},{"key":"ref4","year":"2010","journal-title":"Unique Identification Authority of India (UIADI)"},{"key":"ref3","year":"2010","journal-title":"Iris Recognition Immigration System (IRIS)"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.7312\/gumb92958","author":"gumbel","year":"1958","journal-title":"Statistics of Extremes"},{"key":"ref5","author":"galambos","year":"1987","journal-title":"The Asymptotic Theory of Extreme Order Statistics"},{"key":"ref8","year":"2003","journal-title":"Report to the Congress Use of Technology Standards and Interoperable Databases With Machine-Readable Tamper-Resistant Travel Documents"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-4036-3"},{"key":"ref2","year":"2008","journal-title":"Ballistic Imaging"},{"key":"ref9","article-title":"Studies of fingerprint matching using the NIST verification test bed (VTB)","author":"wilson","year":"2003","journal-title":"National Institute of Standards and Technology Internal Report 7020"},{"key":"ref1","year":"2004","journal-title":"First Phase of Visitor and Immigration Status Program Operating but Improvements Needed"},{"key":"ref20","author":"baveja","year":"2007","journal-title":"An Analysis of the US-VISIT Biometric Program"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33483-2"},{"key":"ref21","article-title":"Fingerprint vendor technology evaluation 2003: Summary of results and analysis report","author":"wilson","year":"2004","journal-title":"National Institute of Standards and Technology Internal Report 7123"},{"key":"ref24","year":"2008","journal-title":"National Institute of Standards and Technology Biometric Quality Workshop II"},{"key":"ref23","author":"jarosz","year":"2005","journal-title":"Biometric Systems Technology Design and Performance Evaluation"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1137\/1123036"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2006.11.021"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10206\/5623286\/05510150.pdf?arnumber=5510150","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:46:55Z","timestamp":1633913215000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5510150\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":26,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tifs.2010.2058105","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"value":"1556-6013","type":"print"},{"value":"1556-6021","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,12]]}}}