{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T15:20:09Z","timestamp":1766157609799},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2013,1,1]],"date-time":"2013-01-01T00:00:00Z","timestamp":1356998400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2013,1]]},"DOI":"10.1109\/tifs.2012.2229987","type":"journal-article","created":{"date-parts":[[2012,11,27]],"date-time":"2012-11-27T19:02:30Z","timestamp":1354042950000},"page":"216-228","source":"Crossref","is-referenced-by-count":14,"title":["Pixel Group Trace Model-Based Quantitative Steganalysis for Multiple Least-Significant Bits Steganography"],"prefix":"10.1109","volume":"8","author":[{"family":"Chunfang Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Fenlin Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xiangyang Luo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ying Zeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2008.2007240"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2011.2175918"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/12.642920"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s00530-003-0100-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2007.897265"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"59","DOI":"10.1007\/978-3-642-24178-9_5","article-title":"Break our steganpgraphic system—The ins and outs of organizing BOSS","volume":"6958","author":"bas","year":"2011","journal-title":"Proc 13th Information Hiding Conf (LNCS)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04431-1_5"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/bxr112"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-010-4105-7"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1007\/11558859_22","article-title":"A general framework for the structural steganalysis of LSB replacement","volume":"3727","author":"ker","year":"2005","journal-title":"Proc 7th Information Hiding Workshop LNCS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.521350"},{"key":"ref6","first-page":"1102","article-title":"Extended optimization method of LSB steganalysis","volume":"2","author":"yu","year":"2005","journal-title":"Proc IEEE Int Conf Image Processing"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2005.855078"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2006.890519"},{"key":"ref7","first-page":"265","article-title":"Weighted stego-image based steganalysis in multiple least significant bits","author":"yu","year":"2008","journal-title":"Proc IEEE Int Conf Multimedia & Expo"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.812753"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-73092-7_4"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/93.959097"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10206\/6392970\/06362207.pdf?arnumber=6362207","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,23]],"date-time":"2021-12-23T19:26:57Z","timestamp":1640287617000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6362207\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,1]]},"references-count":18,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tifs.2012.2229987","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"value":"1556-6013","type":"print"},{"value":"1556-6021","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,1]]}}}