{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T20:27:05Z","timestamp":1759091225754,"version":"3.37.3"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/tifs.2018.2876835","type":"journal-article","created":{"date-parts":[[2018,10,22]],"date-time":"2018-10-22T19:43:28Z","timestamp":1540237408000},"page":"1296-1306","source":"Crossref","is-referenced-by-count":8,"title":["Monitoring Device Current to Characterize Trim Operations of Solid-State Drives"],"prefix":"10.1109","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4595-6957","authenticated-orcid":false,"given":"James","family":"Shey","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1101-2608","authenticated-orcid":false,"given":"Justin A.","family":"Blanco","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9709-5090","authenticated-orcid":false,"given":"Owens","family":"Walker","sequence":"additional","affiliation":[]},{"given":"Thomas W.","family":"Tedesso","sequence":"additional","affiliation":[]},{"given":"Hau T.","family":"Ngo","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9668-5507","authenticated-orcid":false,"given":"Ryan","family":"Rakvic","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7457-1119","authenticated-orcid":false,"given":"Kevin D.","family":"Fairbanks","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"17","article-title":"Empirical analysis on energy efficiency of flash-based SSDs","author":"seo","year":"2008","journal-title":"Proc Conf Power Aware Computing and Systems (HotPower)"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2010.2061228"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379342"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555371"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/PIERS.2017.8261912"},{"journal-title":"AS SSD Benchmark 2018","year":"2018","author":"schepeljansk","key":"ref30"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2012.2191964"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2248288"},{"key":"ref35","first-page":"1","article-title":"WattsUpDoc: Power side channels to nonintrusively discover untargeted malware on embedded medical devices","author":"clark","year":"2013","journal-title":"Proc USENIX Conf Safety Secur Privacy Interoperability Health Inform Technol"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-42033-7_25"},{"journal-title":"Diskpd2018","year":"2018","key":"ref28"},{"journal-title":"KingFast Unknowingly Sends Counterfeit SSD With Fake Memory for Review","year":"2018","key":"ref27"},{"journal-title":"BurnInTest2018","year":"2018","key":"ref29"},{"key":"ref2","first-page":"1","article-title":"Power analysis for flash memory SSD","author":"shin","year":"2010","journal-title":"Proc Workshop Oper Syst Support Non-Volatile RAM (NVRAMOS)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2011.5937213"},{"journal-title":"Intel Confirms Data Corruption Bug in New SSDs Halts Shipments","year":"2009","author":"mearian","key":"ref20"},{"journal-title":"Samsung Botches 960 pro SSD Firmware Update","year":"2017","author":"mason","key":"ref22"},{"journal-title":"Apple Fixes 2015 MacBook Pro Flash Storage Issue in Firmware Update","year":"2015","author":"campbell","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEEM.2009.5373062"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203790"},{"journal-title":"Beware of Counterfeit SSDs—How to Protect Your Data From Loss","year":"2018","key":"ref26"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2714641"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1080\/14786440109462720"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1037\/h0071325"},{"journal-title":"Information technology—ATA command set-4 (ACS-4)","year":"2016","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0705"},{"key":"ref40","first-page":"1","article-title":"SSD characterization: From energy consumption’s perspective","author":"yoo","year":"2011","journal-title":"Proc 3rd USENIX Conf on Hot Topics in Storage and File Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2014.2337256"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2006.11"},{"journal-title":"Protecting Your SSD and Your Data","year":"2016","key":"ref14"},{"journal-title":"Recovering Evidence From SSD Drives in 2014 Understanding TRIM Garbage Collection and Exclusions","year":"2014","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.15394\/jdfsl.2010.1078"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2713127"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.diin.2014.12.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/Anti-Cybercrime.2017.7905296"},{"key":"ref4","first-page":"57","article-title":"Design tradeoffs for SSD performance","author":"agrawal","year":"2008","journal-title":"Proc USENIX Annu Tech Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2013.6558443"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520537"},{"key":"ref8","first-page":"422","article-title":"Performance analysis of SSD write using TRIM in NTFS and EXT4","author":"kim","year":"2011","journal-title":"Proc Comput Sci Converg Inf Technol (ICCIT)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328405"},{"journal-title":"The Elements of Statistical Learning Data Mining Inference and Prediction","year":"2009","author":"hastie","key":"ref49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2523649.2523660"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/UEMCON.2016.7777891"},{"key":"ref45","first-page":"8","article-title":"Reliably erasing data from flash-based solid state drives","author":"wei","year":"2011","journal-title":"Proc USENIX Conf File Storage Technol"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TAU.1967.1161901"},{"journal-title":"Quarterly Market Share Held by NAND Flash Memory Manufacturers Worldwide From 2010 to 2018","year":"2018","key":"ref47"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457154"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/GreenCom-iThings-CPSCom.2013.50"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/MASCOTS.2010.48"},{"key":"ref43","first-page":"1","article-title":"Analysis of peak current consumption for large-scale, parallel flash memory","author":"hong","year":"2011","journal-title":"Proc Workshop Oper Syst Support Non-Volatile RAM (NVRAMOS)"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10206\/8621584\/08501955.pdf?arnumber=8501955","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:59:47Z","timestamp":1657745987000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8501955\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":51,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tifs.2018.2876835","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"type":"print","value":"1556-6013"},{"type":"electronic","value":"1556-6021"}],"subject":[],"published":{"date-parts":[[2019,5]]}}}