{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,18]],"date-time":"2026-01-18T02:52:58Z","timestamp":1768704778375,"version":"3.49.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tifs.2022.3176187","type":"journal-article","created":{"date-parts":[[2022,5,18]],"date-time":"2022-05-18T19:29:33Z","timestamp":1652902173000},"page":"2074-2083","source":"Crossref","is-referenced-by-count":6,"title":["Experimental Evaluation of e.MMC Data Recovery"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6393-5888","authenticated-orcid":false,"given":"Aya","family":"Fukami","sequence":"first","affiliation":[{"name":"Netherland Forensic Institute, Den Haag, GB, The Netherlands"}]},{"given":"Sasha","family":"Sheremetov","sequence":"additional","affiliation":[{"name":"Rusolut Sp. z o. o., Warsaw, Poland"}]},{"given":"Francesco","family":"Regazzoni","sequence":"additional","affiliation":[{"name":"Informatics Institute, University of Amsterdam, Amsterdam, WX, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5912-5295","authenticated-orcid":false,"given":"Zeno","family":"Geradts","sequence":"additional","affiliation":[{"name":"Netherland Forensic Institute, Den Haag, GB, The Netherlands"}]},{"given":"Cees","family":"De Laat","sequence":"additional","affiliation":[{"name":"University of Amsterdam, Amsterdam, WX, The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.diin.2010.01.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.diin.2011.05.016"},{"key":"ref3","first-page":"B6.1","article-title":"Android forensics: A case study of the \u2018HTC incredible\u2019 phone","volume-title":"Proc. Student-Fac. Res. Day","author":"Racioppo"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/app10124231"},{"issue":"1","key":"ref5","article-title":"Android forensics: Simplifying cell phone examinations","volume":"4","author":"Lessard","year":"2010","journal-title":"Small Scale Digit. Device Forensics J."},{"key":"ref6","volume-title":"Mobile Device Forensic Tool Specification, Test Assertions and Test Cases Version 3.1","year":"2021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-59749-651-3.10006-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CAIS.2019.8769520"},{"issue":"1","key":"ref9","first-page":"1","article-title":"Forensic data recovery from flash memory","volume":"1","author":"Breeuwsma","year":"2007","journal-title":"Small Scale Digit. Device Forensics J."},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1201\/9780429322877-8"},{"key":"ref11","article-title":"Mastering eMMC device programming how to maximize speed, quality and cost savings","author":"Gendy","year":"2017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/GCCE.2014.7031128"},{"key":"ref13","volume-title":"Embedded MultiMediaCard (e.MMC) e.MMC\/Card Product Standard, High Capacity, Including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)","year":"2010"},{"key":"ref14","volume-title":"Embedded Multi-Media Card (e.MMC) Electrical Standard (5.1)","year":"2015"},{"key":"ref15","volume-title":"Embedded MultiMediaCard (eMMC) Mechanical Standard","year":"2007"},{"key":"ref16","volume-title":"Samdunk EMMC Backdoor Leading to Bootloader Unlock on Samsung Galaxy Devices","year":"2021"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-78548-124-6.50010-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176622"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176524"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.13.0212.0273"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3078505.3078550"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.diin.2017.01.011"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.diin.2015.01.003"},{"key":"ref24","volume-title":"Open NAND Flash Interface Specification","year":"2021"},{"key":"ref25","volume-title":"e.MMC V4.41 and V4.5 Architecture for High Speed Functions and Features","author":"Tsai","year":"2011"},{"key":"ref26","article-title":"NAND flash data recovery cookbook","author":"Sestanj","year":"2016"},{"key":"ref27","volume-title":"X-ray inspection considerations for surface-mounted flash ICS","year":"2021"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.31399\/asm.cp.istfa2015p0154"},{"key":"ref29","volume-title":"NFI Memory Toolkit","year":"2022"},{"key":"ref30","volume-title":"Visual NAND Reconstructor 5.0","year":"2022"},{"key":"ref31","volume-title":"Flash Extractor","year":"2022"},{"key":"ref32","volume-title":"Raspberry Pi 3 Model B","year":"2022"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3052353"},{"key":"ref34","first-page":"1","article-title":"Security analysis of Android factory resets","volume-title":"Proc. Mobile Secur. Technol. (MOST)","author":"Simon"},{"key":"ref35","volume-title":"Secure an Android device","year":"2020"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICGS3.2019.8688020"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/3407023.3407068"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2958628"},{"key":"ref39","first-page":"8","article-title":"Reliably erasing data from flash-based solid state drives","volume-title":"Proc. 9th USENIX Conf. File Stroage Technol. (FAST)","author":"Wei"},{"key":"ref40","article-title":"In search of lost data: A study of flash sanitization practices","volume-title":"Proc. Digit. Forensics Res. Conf. Eur. (DFRWS EU)","author":"Schneider"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10206\/9652463\/09777707.pdf?arnumber=9777707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:36:18Z","timestamp":1705962978000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9777707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/tifs.2022.3176187","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"value":"1556-6013","type":"print"},{"value":"1556-6021","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}