{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T04:18:04Z","timestamp":1745381884220,"version":"3.40.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2023YFB3106800"],"award-info":[{"award-number":["2023YFB3106800"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62072398"],"award-info":[{"award-number":["62072398"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Cryptologic Science Fund of China","award":["2025NCSF02058"],"award-info":[{"award-number":["2025NCSF02058"]}]},{"name":"National Key Research and Development Program of China","award":["2022YFB3103800"],"award-info":[{"award-number":["2022YFB3103800"]}]},{"DOI":"10.13039\/501100001809","name":"European IPCEI Framework, BPI French Contract-PIIEC MICRO\u00c9LECTRONIQUE- \u201cContinental-SIC,\u201d","doi-asserted-by":"publisher","award":["DOS0220282\/00-DOS0220284\/00"],"award-info":[{"award-number":["DOS0220282\/00-DOS0220284\/00"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"BPI French Contract \u201cSoitec-SIC\u201d","award":["DOS0220776-DOS0220774"],"award-info":[{"award-number":["DOS0220776-DOS0220774"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tifs.2025.3558601","type":"journal-article","created":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T20:59:49Z","timestamp":1744059589000},"page":"4008-4023","source":"Crossref","is-referenced-by-count":0,"title":["Statistical Analysis of Non-Profiling Higher-Order Distinguishers Against Inner Product Masking"],"prefix":"10.1109","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-2596-2221","authenticated-orcid":false,"given":"Qianmei","family":"Wu","sequence":"first","affiliation":[{"name":"School of Cyber Science and Technology, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9433-7576","authenticated-orcid":false,"given":"Wei","family":"Cheng","sequence":"additional","affiliation":[{"name":"LTCI, Institut Polytechnique de Paris, Télécom Paris, Palaiseau, France"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6087-8243","authenticated-orcid":false,"given":"Fan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Cyber Science and Technology, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5044-3534","authenticated-orcid":false,"given":"Sylvain","family":"Guilley","sequence":"additional","affiliation":[{"name":"LTCI, Institut Polytechnique de Paris, Télécom Paris, Palaiseau, France"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-68697-5_9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-54669-8_11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-75208-2_8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tifs.2020.3009609"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-70694-8_25"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45146-4_27"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2022.i3.192-222"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2009.15"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tifs.2022.3209890"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2024.3424208"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_4"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85886-7_24"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3222760"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-97-1235-9_13"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85053-3_27"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-27257-8_15"},{"key":"ref19","volume":"16","author":"MacWilliams","year":"1977","journal-title":"The Theory of Error-Correcting Codes"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44499-8_19"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24660-2_18"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-38162-6"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2005.862437"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74735-2_31"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-01001-9_26"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.13154\/tches.v2019.i2.107-131"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10206\/10810755\/10955261.pdf?arnumber=10955261","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,22]],"date-time":"2025-04-22T17:38:40Z","timestamp":1745343520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10955261\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/tifs.2025.3558601","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"type":"print","value":"1556-6013"},{"type":"electronic","value":"1556-6021"}],"subject":[],"published":{"date-parts":[[2025]]}}}