{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,24]],"date-time":"2026-09-24T17:06:54Z","timestamp":1790269614132,"version":"4.1.0"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans.Inform.Forensic Secur."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tifs.2026.3725568","type":"journal-article","created":{"date-parts":[[2026,8,19]],"date-time":"2026-08-19T19:05:12Z","timestamp":1787166312000},"page":"8314-8326","source":"Crossref","is-referenced-by-count":0,"title":["A Multigranularity Embedding Guided Open-Set Recognition for Fine-Grained Specific Emitter Identification"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3940-4259","authenticated-orcid":false,"given":"Minhong","family":"Sun","sequence":"first","affiliation":[{"name":"Hangzhou Dianzi University","place":["Hangzhou, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-3646-7339","authenticated-orcid":false,"given":"Xinyuan","family":"Liu","sequence":"additional","affiliation":[{"name":"Hangzhou Dianzi University","place":["Hangzhou, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7278-4568","authenticated-orcid":false,"given":"Jiazhong","family":"Teng","sequence":"additional","affiliation":[{"name":"Hangzhou Dianzi University","place":["Hangzhou, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3790-521X","authenticated-orcid":false,"given":"Zhaoyang","family":"Qiu","sequence":"additional","affiliation":[{"name":"Hangzhou Dianzi University","place":["Hangzhou, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-0254-4752","authenticated-orcid":false,"given":"Mangqing","family":"Guo","sequence":"additional","affiliation":[{"name":"Hangzhou Dianzi University","place":["Hangzhou, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-4144-8962","authenticated-orcid":false,"given":"Deguo","family":"Zeng","sequence":"additional","affiliation":[{"name":"Nanjing Electronic Equipment Institute","place":["Nanjing, China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2023.3312669"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2022.109455"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTMA52658.2021.00039"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOTM.0001.1900065"},{"issue":"9","key":"ref5","doi-asserted-by":"crossref","first-page":"35","DOI":"10.1016\/j.cja.2021.08.016","article-title":"Large-scale real-world radio signal recognition with deep learning","volume":"35","author":"Ya","year":"2022","journal-title":"Chin. J. Aeronaut."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCCN.2024.3408417"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCCN.2024.3391293"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2024.3463535"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14030430"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3300122"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s25175415"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2025.110295"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3176758"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.173"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3457832"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v39i1.32003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2025.3598034"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3191696"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/rs15164107"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2022.3152404"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2025.110137"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2025.110344"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2025.3560233"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3361899"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3404042"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2025.3605912"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/electronics14091785"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/mwc.2026.3690104"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW63382.2024.00269"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s11063-024-11557-5"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2024.3351439"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-023-4174-4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.125150"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-025-02422-6"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/EEICE65049.2025.11034159"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-025-07752-3"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/app13063878"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.109170"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v37i2.25274"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2023.3313727"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00060"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-09625-4"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2025.107423"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00482"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2021.3070186"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1049\/cmu2.12726"}],"container-title":["IEEE Transactions on Information Forensics and Security"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10206\/11313711\/11659600.pdf?arnumber=11659600","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,24]],"date-time":"2026-09-24T16:39:34Z","timestamp":1790267974000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11659600\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/tifs.2026.3725568","relation":{},"ISSN":["1556-6013","1556-6021"],"issn-type":[{"value":"1556-6013","type":"print"},{"value":"1556-6021","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}