{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T10:54:40Z","timestamp":1779879280074,"version":"3.53.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tii.2010.2098416","type":"journal-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:05:02Z","timestamp":1295640302000},"page":"187-195","source":"Crossref","is-referenced-by-count":26,"title":["A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering"],"prefix":"10.1109","volume":"7","author":[{"given":"Tian-Hong","family":"Pan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bi-Qi","family":"Sheng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David Shan-Hill","family":"Wong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shi-Shang","family":"Jang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-005-0008-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10325"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2008.07.009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511806384.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2008.07.012"},{"key":"ref15","author":"montgomery","year":"2001","journal-title":"Introduction to Linear Regression Analysis"},{"key":"ref16","author":"chang","year":"2001","journal-title":"LIBSVM A library for support vector machines"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2007.897275"},{"key":"ref3","first-page":"124","article-title":"Application development of virtual metrology in semiconductor industry","author":"chang","year":"0","journal-title":"Proc 32nd Annu Conf IEEE Ind Elec Soc (IECON 2005)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2009.05.053"},{"key":"ref5","first-page":"385","article-title":"The use of hierarchical data analysis to predict end of line electrical test parameters from in-line FDC data","author":"bunkofske","year":"2004","journal-title":"Proc AEC\/APC Symp XVI"},{"key":"ref8","first-page":"1611","volume":"3614","author":"hu","year":"2005","journal-title":"Lecture Notes in Computer Science"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2008.04.014"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.907609"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471790281"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2011185"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9424\/5762835\/05692873.pdf?arnumber=5692873","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:22Z","timestamp":1633909582000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5692873\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":16,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tii.2010.2098416","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}