{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T01:15:55Z","timestamp":1767921355057,"version":"3.49.0"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tii.2011.2106451","type":"journal-article","created":{"date-parts":[[2011,2,3]],"date-time":"2011-02-03T21:29:22Z","timestamp":1296768562000},"page":"196-203","source":"Crossref","is-referenced-by-count":25,"title":["Integral-Square-Error Performance of Multiplexed Model Predictive Control"],"prefix":"10.1109","volume":"7","author":[{"given":"Keck Voon","family":"Ling","sequence":"first","affiliation":[]},{"given":"Weng Khuen","family":"Ho","sequence":"additional","affiliation":[]},{"given":"Yong","family":"Feng","sequence":"additional","affiliation":[]},{"given":"Bingfang","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Multiplexed model predictive control","author":"ling","year":"2005","journal-title":"Proc 16th IFAC World Congress"},{"key":"ref11","author":"ling","year":"2006","journal-title":"Multiplexed model predictive control"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"1371","DOI":"10.1109\/TCST.2009.2036155","article-title":"Multiplexed MPC for multi-zone thermal processing in semiconductor manufacturing","volume":"18","author":"ling","year":"2010","journal-title":"IEEE Trans Control Syst Technol"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"376","DOI":"10.1109\/TSM.2007.907610","article-title":"Critical dimension uniformity via real time photoresist thickness control","volume":"20","author":"ho","year":"2007","journal-title":"IEEE Trans Semiconductor Manuf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/12.601087"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/1.1683338"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.712145"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2007.11.009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICARCV.2008.4795583"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/ie061011p"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.923787"},{"key":"ref3","year":"2010","journal-title":"Lecture Notes in Control and Information Sciences"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.2002703"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.2002702"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2015753"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011604"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2017999"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007525"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2009.2017934"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/9.1286"},{"key":"ref21","author":"maciejowski","year":"2002","journal-title":"Predictive Control with Constraints"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9424\/5762835\/05708191.pdf?arnumber=5708191","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:37Z","timestamp":1633909597000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5708191\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":21,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tii.2011.2106451","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}