{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T16:35:01Z","timestamp":1778258101406,"version":"3.51.4"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,11,1]],"date-time":"2013-11-01T00:00:00Z","timestamp":1383264000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/Crown.html"},{"start":{"date-parts":[[2013,11,1]],"date-time":"2013-11-01T00:00:00Z","timestamp":1383264000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/Crown.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/tii.2012.2214394","type":"journal-article","created":{"date-parts":[[2012,8,21]],"date-time":"2012-08-21T18:06:14Z","timestamp":1345572374000},"page":"2239-2247","source":"Crossref","is-referenced-by-count":252,"title":["A Novel Scheme for Key Performance Indicator Prediction and Diagnosis With Application to an Industrial Hot Strip Mill"],"prefix":"10.1109","volume":"9","author":[{"given":"Steven X.","family":"Ding","sequence":"first","affiliation":[]},{"given":"Shen","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Kaixiang","family":"Peng","sequence":"additional","affiliation":[]},{"given":"Haiyang","family":"Hao","sequence":"additional","affiliation":[]},{"given":"Bo","family":"Shen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/ie200274q"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2025124"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2159693"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2010.2103401"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2008.10.008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/cem.1180020306"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2030793"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.10.030"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"168","DOI":"10.1002\/aic.11977","article-title":"Total projection to latent structures for process monitoring","volume":"56","author":"zhou","year":"2010","journal-title":"AIChE J"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2006.05.045"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2008.930199"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(99)00030-X"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.2007802"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.2002920"},{"key":"ref29","first-page":"840","article-title":"Data-driven design of model-based fault diagnosis systems","author":"ding","year":"2012","journal-title":"Proc IFAC Int Symp ADCHEM"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","author":"chiang","year":"2001","journal-title":"Fault Detection and Diagnosis in Industrial Systems"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.47.1732"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2033181"},{"key":"ref2","author":"ding","year":"2008","journal-title":"Model-Based Fault Diagnosis Techniques"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2023318"},{"key":"ref1","author":"gertler","year":"1998","journal-title":"Fault Detection and Diagnosis in Engineering Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/aic.12554"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.07.002"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2010.02.004"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(02)00016-1"},{"key":"ref23","first-page":"12389","article-title":"Study on modifications of PLS approach for process monitoring","author":"yin","year":"2011","journal-title":"Proc 18th IFAC World Congress"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(94)00091-V"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9424\/6631519\/06276255.pdf?arnumber=6276255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,28]],"date-time":"2024-04-28T15:26:07Z","timestamp":1714317967000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6276255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":29,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tii.2012.2214394","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,11]]}}}