{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,6,15]],"date-time":"2024-06-15T09:59:37Z","timestamp":1718445577307},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2013,8,1]],"date-time":"2013-08-01T00:00:00Z","timestamp":1375315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/tii.2012.2221471","type":"journal-article","created":{"date-parts":[[2012,10,1]],"date-time":"2012-10-01T18:49:29Z","timestamp":1349117369000},"page":"1680-1687","source":"Crossref","is-referenced-by-count":13,"title":["Finding Optimal Focusing Distance and Edge Blur Distribution for Weakly Calibrated 3-D Vision"],"prefix":"10.1109","volume":"9","author":[{"family":"Shengyong Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y. F.","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"131","DOI":"10.1109\/TPAMI.2007.1143","article-title":"Free-form object reconstruction from silhouettes, occluding edges and texture edges: A unified and robust operator based on duality","volume":"30","author":"liu","year":"2008","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1460","DOI":"10.1109\/TPAMI.2007.70789","article-title":"Subpixel photometric stereo","volume":"30","author":"tan","year":"2008","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2006.12.023"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.2011760"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2030609"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2008.133"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"792","DOI":"10.1109\/TGRS.2008.2004709","article-title":"Deblurring from highly incomplete measurements for remote sensing","volume":"47","author":"ma","year":"2009","journal-title":"IEEE Trans Geosci Remote Sens"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2171173"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2009.2036708"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2070062"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.925016"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2188900"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2174062"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2172449"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2009.202"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cvi.2007.0043"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2007.1175"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2166780"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2172450"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2173945"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/el:19980762"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/83.217219"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2179664"},{"key":"ref24","doi-asserted-by":"crossref","DOI":"10.4324\/9780080499253","author":"ray","year":"2002","journal-title":"Applied Photographic Optics"},{"key":"ref23","first-page":"5357","article-title":"A focal cue for metric measurement of 3-D surfaces","author":"chen","year":"2006","journal-title":"Proc IEEE\/RSJ Int Conf Intell Robots Syst"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TRA.2003.808859"},{"key":"ref25","article-title":"Depth of field","author":"qatsi","year":"2012"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9424\/6582568\/06317177.pdf?arnumber=6317177","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:45:40Z","timestamp":1638218740000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6317177\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":27,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tii.2012.2221471","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,8]]}}}