{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T00:35:31Z","timestamp":1770338131855,"version":"3.49.0"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61673097"],"award-info":[{"award-number":["61673097"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61490704"],"award-info":[{"award-number":["61490704"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61525302"],"award-info":[{"award-number":["61525302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573022"],"award-info":[{"award-number":["61573022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61304107"],"award-info":[{"award-number":["61304107"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["N160804002"],"award-info":[{"award-number":["N160804002"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["N160801001"],"award-info":[{"award-number":["N160801001"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"name":"International Postdoctoral Exchange Fellowship Program","award":["20130020"],"award-info":[{"award-number":["20130020"]}]},{"name":"National High-Tech. Research and Development Program of China","award":["2015AA043802"],"award-info":[{"award-number":["2015AA043802"]}]},{"name":"Fundamental Disciplinary Research Program of the Shenzhen Committee on Science and Innovation","award":["20160207"],"award-info":[{"award-number":["20160207"]}]},{"name":"Texas-Wisconsin-California Control Consortium"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/tii.2017.2700520","type":"journal-article","created":{"date-parts":[[2017,5,2]],"date-time":"2017-05-02T18:23:23Z","timestamp":1493749403000},"page":"2203-2213","source":"Crossref","is-referenced-by-count":45,"title":["Unevenly Sampled Dynamic Data Modeling and Monitoring With an Industrial Application"],"prefix":"10.1109","volume":"13","author":[{"given":"Qiang","family":"Liu","sequence":"first","affiliation":[]},{"given":"S. Joe","family":"Qin","sequence":"additional","affiliation":[]},{"given":"Tianyou","family":"Chai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2307\/2333955"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.jtice.2010.03.015"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(00)00041-X"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/0009-2509(93)85001-6"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301761"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1021\/ie048873f"},{"key":"ref36","first-page":"161","article-title":"Perspectives on big data modeling of process industries","volume":"42","author":"liu","year":"2016","journal-title":"Acta Autom Sinica"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.08.167"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2550426"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2530047"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1021\/ie000141+"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2532284"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199809\/10)12:5<301::AID-CEM515>3.3.CO;2-J"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2004.06.010"},{"key":"ref14","first-page":"41","article-title":"A theoretical basis for the use of principal component models for monitoring multivariate processes","volume":"1","author":"wise","year":"1990","journal-title":"Process Control and Quality"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/0967-0661(95)00014-L"},{"key":"ref16","first-page":"1690","article-title":"LGS-MMDPCA vased modeling and online monitoring for multiple operating batch processes","volume":"23","author":"wang","year":"2016","journal-title":"Control Eng China"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2016.07.340"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1162\/0899766042321814"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"168","DOI":"10.1002\/aic.11977","article-title":"Total projection to latent structures for process monitoring","volume":"56","author":"zhou","year":"2010","journal-title":"AIChE J"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690430916"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2509247"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2014.03.006"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2032654"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2167110"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(95)00011-P"},{"key":"ref5","first-page":"310","article-title":"Quality-related fault detection approach based on orthogonal signal correction and modified PLS","volume":"11","author":"wang","year":"2015","journal-title":"IEEE Trans Ind Informat"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2522944"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2160138"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2538745"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/aic.13959"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.5450690105"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"2262","DOI":"10.1109\/TNN.2011.2165853","article-title":"Quality relevant data-driven modeling and monitoring of multivariate dynamic processes: Dynamic T-PLS approach","volume":"22","author":"li","year":"2011","journal-title":"IEEE Trans Neural Netw"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.10.030"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2013.2264723"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/707953"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2016.07.261"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2303781"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/8059716\/07917368.pdf?arnumber=7917368","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T03:19:33Z","timestamp":1750216773000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7917368\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":40,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2017.2700520","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,10]]}}}