{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T13:27:03Z","timestamp":1778160423401,"version":"3.51.4"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61503039"],"award-info":[{"award-number":["61503039"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61503040"],"award-info":[{"award-number":["61503040"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/tii.2018.2871515","type":"journal-article","created":{"date-parts":[[2018,9,20]],"date-time":"2018-09-20T18:59:36Z","timestamp":1537469976000},"page":"2682-2690","source":"Crossref","is-referenced-by-count":29,"title":["Efficient Nonlinear Fault Diagnosis Based on Kernel Sample Equivalent Replacement"],"prefix":"10.1109","volume":"15","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8014-6119","authenticated-orcid":false,"given":"Guang","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6296-4652","authenticated-orcid":false,"given":"Jianfang","family":"Jiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3802-9269","authenticated-orcid":false,"given":"Shen","family":"Yin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2668987"},{"key":"ref38","doi-asserted-by":"crossref","first-page":"275","DOI":"10.1016\/j.isatra.2016.10.015","article-title":"A nonlinear quality-related fault detection approach based on modified kernel partial least squares","volume":"66","author":"jiao","year":"2017","journal-title":"ISA Trans"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733501"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(98)00027-6"},{"key":"ref31","first-page":"1357","article-title":"Variable selection using svm-based criteria","volume":"3","author":"rakotomamonjy","year":"2003","journal-title":"J Mach Learn Res"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2004.08.007"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2697210"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2010.05.012"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1021\/ie000141+"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/ie9018947"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2576999"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.06.004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2016.03.021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2497204"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"276","DOI":"10.1016\/j.isatra.2017.01.029","article-title":"A kpi-based process monitoring and fault detection framework for large-scale processes","volume":"68","author":"zhang","year":"2017","journal-title":"ISA Trans"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2637886"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2003.09.012"},{"key":"ref16","first-page":"97","article-title":"Kernel partial least squares regression in reproducing kernel hilbert space","volume":"2","year":"2002","journal-title":"J Mach Learn Res"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2004.05.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2345331"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2011.11.015"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/cem.2629"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2011.04.025"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0009-2509(01)00366-9"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2015.09.013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.873524"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00058-7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2010.11.004"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2015.12.015"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S1874-1029(14)60005-7"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2010.2071415"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2013.10.004"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2633989"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2012.11.013"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.02.027"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.22855"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/8705698\/08469096.pdf?arnumber=8469096","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:54:03Z","timestamp":1657745643000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8469096\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":41,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2018.2871515","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,5]]}}}