{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,11]],"date-time":"2026-04-11T10:21:57Z","timestamp":1775902917057,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2021,3,1]],"date-time":"2021-03-01T00:00:00Z","timestamp":1614556800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61572114"],"award-info":[{"award-number":["61572114"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Major R & D Program","award":["2018YFB0904900"],"award-info":[{"award-number":["2018YFB0904900"]}]},{"name":"National Major R & D Program","award":["2018YFB0904905"],"award-info":[{"award-number":["2018YFB0904905"]}]},{"name":"Sichuan Science and Technology Service Development Project","award":["18KJFWSF0368"],"award-info":[{"award-number":["18KJFWSF0368"]}]},{"name":"Sichuan Science and Technology Basic Research Condition Platform Project","award":["2018TJPT0041"],"award-info":[{"award-number":["2018TJPT0041"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2021,3]]},"DOI":"10.1109\/tii.2020.2963962","type":"journal-article","created":{"date-parts":[[2020,1,15]],"date-time":"2020-01-15T16:41:14Z","timestamp":1579106474000},"page":"2041-2051","source":"Crossref","is-referenced-by-count":65,"title":["Automated Labeling and Learning for Physical Layer Authentication Against Clone Node and Sybil Attacks in Industrial Wireless Edge Networks"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2504-5630","authenticated-orcid":false,"given":"Songlin","family":"Chen","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7474-4294","authenticated-orcid":false,"given":"Zhibo","family":"Pang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0073-6101","authenticated-orcid":false,"given":"Hong","family":"Wen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6777-8197","authenticated-orcid":false,"given":"Kan","family":"Yu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0037-7345","authenticated-orcid":false,"given":"Tengyue","family":"Zhang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3196-0349","authenticated-orcid":false,"given":"Yueming","family":"Lu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2925418"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2846549"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2843169"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2827920"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2855746"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2902574"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2843802"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2791619"},{"key":"ref18","article-title":"Radio frequency measurements for selected manufacturing and industrial environments","author":"candell","year":"2016"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MNET.2013.6523806"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2888693"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2012.104"},{"key":"ref6","first-page":"37","author":"wen","year":"2013","journal-title":"Physical Layer Assisted Authentication for Wireless Sensor Networks"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2018.8592783"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWC.001.1900061"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-wss.2010.0101"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2019.2899421"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2018.2874385"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/6039878"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2012.0300"},{"key":"ref21","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9281052\/08960424.pdf?arnumber=8960424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:49:30Z","timestamp":1641988170000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8960424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3]]},"references-count":21,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tii.2020.2963962","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,3]]}}}