{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T21:46:04Z","timestamp":1768340764771,"version":"3.49.0"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"UK's Engineering and Physical Sciences Research Council","award":["EP\/P006833\/1"],"award-info":[{"award-number":["EP\/P006833\/1"]}]},{"DOI":"10.13039\/501100005145","name":"Basic Research Program of Jiangsu Province","doi-asserted-by":"publisher","award":["SBK2019042353"],"award-info":[{"award-number":["SBK2019042353"]}],"id":[{"id":"10.13039\/501100005145","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2021,1]]},"DOI":"10.1109\/tii.2020.2965202","type":"journal-article","created":{"date-parts":[[2020,1,9]],"date-time":"2020-01-09T21:23:10Z","timestamp":1578604990000},"page":"463-472","source":"Crossref","is-referenced-by-count":107,"title":["Efficient Multitask Structure-Aware Sparse Bayesian Learning for Frequency-Difference Electrical Impedance Tomography"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6579-9798","authenticated-orcid":false,"given":"Shengheng","family":"Liu","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3616-4616","authenticated-orcid":false,"given":"Yongming","family":"Huang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8411-1127","authenticated-orcid":false,"given":"Hancong","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5146-4807","authenticated-orcid":false,"given":"Chao","family":"Tan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5073-5126","authenticated-orcid":false,"given":"Jiabin","family":"Jia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/aa8016"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/1\/015501"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2009.2022540"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2011.07.055"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/30\/6\/S03"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/12\/309"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0170563"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/7\/075004"},{"key":"ref12","first-page":"2494","article-title":"Electrical impedance tomography: Tissue properties to image measures","volume":"66","author":"adler","year":"2017","journal-title":"IEEE Trans Biomed Eng"},{"key":"ref13","author":"holder","year":"2006","journal-title":"Electrical Impedance Tomography Methods History and Applications"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/6\/1179"},{"key":"ref15","author":"kaipio","year":"2006","journal-title":"Statistical and Computational Inverse Problems"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1017\/S0962492910000061"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2241055"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2816739"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2895469"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2015.2402661"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/29\/8\/006"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2710146"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/0309190021000059687"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10439-008-9537-5"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6579\/ab0b55"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2015.2509508"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1137\/16M1061564"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2013.2284966"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2595399"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.resp.2018.03.016"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2569522"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2594758"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2014.2319334"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2813977"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.1994.412155"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895929"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2898091"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2015.10.027"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9244668\/08954757.pdf?arnumber=8954757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:52:29Z","timestamp":1652194349000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8954757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,1]]},"references-count":35,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tii.2020.2965202","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,1]]}}}