{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T19:05:31Z","timestamp":1775588731891,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61873315"],"award-info":[{"award-number":["61873315"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["F2018202078"],"award-info":[{"award-number":["F2018202078"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["F2019202305"],"award-info":[{"award-number":["F2019202305"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2021,6]]},"DOI":"10.1109\/tii.2020.3008021","type":"journal-article","created":{"date-parts":[[2020,7,8]],"date-time":"2020-07-08T20:31:39Z","timestamp":1594240299000},"page":"4084-4095","source":"Crossref","is-referenced-by-count":198,"title":["Deep Learning-Based Solar-Cell Manufacturing Defect Detection With Complementary Attention Network"],"prefix":"10.1109","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9234-2002","authenticated-orcid":false,"given":"Binyi","family":"Su","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5262-4208","authenticated-orcid":false,"given":"Haiyong","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4941-8032","authenticated-orcid":false,"given":"Peng","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4708-2245","authenticated-orcid":false,"given":"Guibin","family":"Bian","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0774-3635","authenticated-orcid":false,"given":"Kun","family":"Liu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6366-3352","authenticated-orcid":false,"given":"Weipeng","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2002.1017623"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2014.131"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref31","first-page":"1","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"0","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.319"},{"key":"ref37","article-title":"YOLOv3: An incremental improvement","author":"redmon","year":"2018"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.319"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.74"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2900961"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764844"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844805"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2019.02.067"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1458-z"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2018.12.013"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"457","DOI":"10.1016\/j.isatra.2019.07.001","article-title":"A novel deep learning based fault diagnosis approach for chemical process with extended deep belief network","volume":"96","author":"wang","year":"2019","journal-title":"ISA Trans"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2809730"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2938890"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2902129"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2017.119"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01234-2_1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI.2015.7163921"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-15"},{"key":"ref29","first-page":"1","article-title":"Network in network","author":"lin","year":"0","journal-title":"Proc Int Conf Learn Representations"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2010.2092783"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2015.01.014"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.12.007"},{"key":"ref2","first-page":"200","article-title":"Research to the typical defects of crystalline silicon photovoltaic cells based on EL Images","volume":"3","author":"wang","year":"2013","journal-title":"Int J Energy Sci"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2015.2494692"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-008-4986-0"},{"key":"ref20","first-page":"1243","article-title":"Learning to combine foveal glimpses with a third-order Boltzmann machine","author":"larochelle","year":"0","journal-title":"Proc Int Conf Neural Inf Process"},{"key":"ref22","article-title":"Improving object detection from scratch via gated feature reuse","author":"shen","year":"0"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00813"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2935153"},{"key":"ref23","article-title":"SSA-CNN: Semantic self-attention CNN for pedestrian detection","author":"zhou","year":"0"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.338"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9371456\/09136904.pdf?arnumber=9136904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:52:43Z","timestamp":1652194363000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9136904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6]]},"references-count":40,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tii.2020.3008021","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,6]]}}}