{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T02:08:46Z","timestamp":1780106926288,"version":"3.54.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077110"],"award-info":[{"award-number":["52077110"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52007088"],"award-info":[{"award-number":["52007088"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/tii.2021.3089333","type":"journal-article","created":{"date-parts":[[2021,6,15]],"date-time":"2021-06-15T20:08:26Z","timestamp":1623787706000},"page":"1629-1640","source":"Crossref","is-referenced-by-count":98,"title":["Development of a Physics-Informed Doubly Fed Cross-Residual Deep Neural Network for High-Precision Magnetic Flux Leakage Defect Size Estimation"],"prefix":"10.1109","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0712-6389","authenticated-orcid":false,"given":"Hongyu","family":"Sun","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7315-2692","authenticated-orcid":false,"given":"Lisha","family":"Peng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4442-2566","authenticated-orcid":false,"given":"Songling","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2509-5523","authenticated-orcid":false,"given":"Shisong","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4577-5005","authenticated-orcid":false,"given":"Yue","family":"Long","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5140-648X","authenticated-orcid":false,"given":"Shen","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3679-6165","authenticated-orcid":false,"given":"Wei","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2207732"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"436","DOI":"10.1038\/nature14539","article-title":"Deep learning","volume":"521","author":"yann","year":"2015","journal-title":"Nature"},{"key":"ref11","article-title":"Computerized ultrasonic imaging inspection: From shallow to deep learning","volume":"18","year":"2018","journal-title":"SENSORS"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665X\/ab58d6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2019.102164"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102218"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.5031651"},{"key":"ref16","article-title":"Defect size estimation method for magnetic flux leakage signals using convolutional neural networks","volume":"62","author":"wang","year":"2020","journal-title":"Insight"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9128671"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1113\/jphysiol.1968.sp008455"},{"key":"ref19","first-page":"396","article-title":"Handwritten digit recognition with a back-propagation network","author":"cun","year":"1990","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2008.08.005"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2018.00097"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2943669"},{"key":"ref27","first-page":"1","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"0","journal-title":"Proc 3rd Int Conf Learn Representations"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.10.006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2012.55.3.126"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.919011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.1558693"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2828811"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2963795"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2994227"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"1527","DOI":"10.1162\/neco.2006.18.7.1527","article-title":"A fast learning algorithm for deep belief nets","volume":"18","author":"geoffrey","year":"2006","journal-title":"Neural Comput"},{"key":"ref20","first-page":"448","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"loffe","year":"0","journal-title":"Proc 32nd Int Conf Mach Learn"},{"key":"ref22","first-page":"1","article-title":"Determination scheme for accurate defect depth in underground pipeline inspection by using magnetic flux leakage sensors","volume":"54","author":"hui","year":"2018","journal-title":"IEEE Trans Magn"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2869438"},{"key":"ref24","first-page":"271","author":"duda","year":"1973","journal-title":"Pattern Classification and Scene Analysis"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-017-0396-6"},{"key":"ref26","first-page":"315","article-title":"Deep sparse rectifier neural networks","author":"glorot","year":"2011","journal-title":"Proc 14th Int Conf Artif Intell Statist"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9640533\/09456074.pdf?arnumber=9456074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,8]],"date-time":"2022-03-08T21:26:58Z","timestamp":1646774818000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9456074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tii.2021.3089333","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,3]]}}}