{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:06:03Z","timestamp":1781280363520,"version":"3.54.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077110"],"award-info":[{"award-number":["52077110"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52007088"],"award-info":[{"award-number":["52007088"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2022,5]]},"DOI":"10.1109\/tii.2021.3105537","type":"journal-article","created":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T20:17:43Z","timestamp":1629317863000},"page":"3235-3247","source":"Crossref","is-referenced-by-count":78,"title":["Microcrack Defect Quantification Using a Focusing High-Order SH Guided Wave EMAT: The Physics-Informed Deep Neural Network GuwNet"],"prefix":"10.1109","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0712-6389","authenticated-orcid":false,"given":"Hongyu","family":"Sun","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7315-2692","authenticated-orcid":false,"given":"Lisha","family":"Peng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Junming","family":"Lin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5140-648X","authenticated-orcid":false,"given":"Shen","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3679-6165","authenticated-orcid":false,"given":"Wei","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4442-2566","authenticated-orcid":false,"given":"Songling","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3089333"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2020.120375"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.08.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2015.05.005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2582735"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/195682"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2017.04.001"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/58.753022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.54.07HC04"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2863546"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.03.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3033941"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2943669"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-020-00739-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2959810"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665X\/ab58d6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2869438"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2866299"},{"key":"ref29","article-title":"Physics-guided neural networks (PGNN): An application in lake temperature modeling","author":"karpatne","year":"2017"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.10.006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2012.55.3.126"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3025050"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2994227"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2775343"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1177\/1475921713498532"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2019.03.006"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.02.026"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1177\/1475921716673567"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.4789146"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2020.102218"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3063736"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9702746\/09516908.pdf?arnumber=9516908","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T20:53:47Z","timestamp":1650920027000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9516908\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5]]},"references-count":31,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2021.3105537","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,5]]}}}