{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,2]],"date-time":"2026-04-02T16:01:37Z","timestamp":1775145697493,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2022,7]]},"DOI":"10.1109\/tii.2021.3105932","type":"journal-article","created":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T20:17:43Z","timestamp":1629317863000},"page":"4417-4426","source":"Crossref","is-referenced-by-count":78,"title":["Turn-to-Turn Short Circuit Fault Localization in Transformer Winding via Image Processing and Deep Learning Method"],"prefix":"10.1109","volume":"18","author":[{"given":"Arash","family":"Moradzadeh","sequence":"first","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7075-1609","authenticated-orcid":false,"given":"Hamed","family":"Moayyed","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Porto, Porto, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0255-8353","authenticated-orcid":false,"given":"Behnam","family":"Mohammadi-Ivatloo","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1521-790X","authenticated-orcid":false,"given":"G. B.","family":"Gharehpetian","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7105-0505","authenticated-orcid":false,"given":"A. Pedro","family":"Aguiar","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Porto, Porto, Portugal"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MCSE.2007.55"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.834345"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.10.024"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2987205"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.10.014"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2054840"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108322"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.5812"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2938020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2998877"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2014.0182"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.12.045"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2019.0320"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3051411"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3007607"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACEMP-OPTIM44294.2019.9007176"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3016966"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2907648"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2739340"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2651954"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2009.5282097"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACEMP-OPTIM44294.2019.9007169"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2893279"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.02.026"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2626779"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106854"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.106933"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3052144"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108815"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2909144"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1989.1.4.541"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5331"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9759242\/09516903.pdf?arnumber=9516903","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,30]],"date-time":"2022-05-30T21:45:44Z","timestamp":1653947144000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9516903\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7]]},"references-count":32,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tii.2021.3105932","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,7]]}}}