{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T06:25:53Z","timestamp":1775715953839,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62075163"],"award-info":[{"award-number":["62075163"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2022,6]]},"DOI":"10.1109\/tii.2021.3120027","type":"journal-article","created":{"date-parts":[[2021,10,15]],"date-time":"2021-10-15T16:37:30Z","timestamp":1634315850000},"page":"3670-3680","source":"Crossref","is-referenced-by-count":19,"title":["Visual Early Leakage Detection for Industrial Surveillance Environments"],"prefix":"10.1109","volume":"18","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8374-291X","authenticated-orcid":false,"given":"Chengang","family":"Lyu","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2581-8290","authenticated-orcid":false,"given":"Yage","family":"Liu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8312-2972","authenticated-orcid":false,"given":"Xuekai","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8661-4051","authenticated-orcid":false,"given":"Yuxin","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8476-8647","authenticated-orcid":false,"given":"Jie","family":"Jin","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2558-552X","authenticated-orcid":false,"given":"Jiachen","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2963434"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2915592"},{"key":"ref31","first-page":"6105","article-title":"EfficientNet: Rethinking model scaling for convolutional neural networks","author":"tan","year":"2019","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2969076"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2921779"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1137\/15M1033344"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2665584"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2020.1003234"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-65172-9_16"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2209663"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2668438"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2015.2430453"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2013.2261566"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2930078"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2218251"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2020.1003387"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2101613"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2017.7510418"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2257804"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2963910"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2991639"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2874583"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2871720"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2740220"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2021.1003925"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2358842"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2020.1003114"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2018.7511186"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2875149"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MNET.001.1900100"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2952261"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2992229"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2172452"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2166797"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9717272\/09573329.pdf?arnumber=9573329","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T20:31:18Z","timestamp":1650918678000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9573329\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6]]},"references-count":36,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tii.2021.3120027","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,6]]}}}