{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T11:48:57Z","timestamp":1781264937418,"version":"3.54.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973024"],"award-info":[{"award-number":["61973024"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973022"],"award-info":[{"award-number":["61973022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073022"],"award-info":[{"award-number":["62073022"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/tii.2022.3182774","type":"journal-article","created":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T20:26:32Z","timestamp":1655238392000},"page":"6284-6294","source":"Crossref","is-referenced-by-count":43,"title":["Farthest-Nearest Distance Neighborhood and Locality Projections Integrated With Bootstrap for Industrial Process Fault Diagnosis"],"prefix":"10.1109","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6793-1518","authenticated-orcid":false,"given":"Ning","family":"Zhang","sequence":"first","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5490-2892","authenticated-orcid":false,"given":"Yuan","family":"Xu","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2719-0516","authenticated-orcid":false,"given":"Qun-Xiong","family":"Zhu","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9999-3679","authenticated-orcid":false,"given":"Yan-Lin","family":"He","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.buildenv.2022.109010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2658732"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3016966"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3030179"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2020.103631"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3125975"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2020.3046044"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2988208"},{"key":"ref17","first-page":"153","article-title":"Locality preserving projections","volume":"16","author":"he","year":"2004","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2767698"},{"key":"ref19","first-page":"1","article-title":"High-dimensionality graph data reduction based on a proposed new algorithm","volume":"63","author":"al-omairi","year":"2019","journal-title":"Lecture Notes Comput Sci"},{"key":"ref18","first-page":"1208","article-title":"Neighborhood preserving embedding","volume":"1","author":"he","year":"2005","journal-title":"Proc 10th Proc Eur Conf Comput Vis"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS52934.2021.9455580"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111037"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104811"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3037730"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b03752"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3056533"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3059459"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.116503"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jtice.2021.104200"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2019.04.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3051054"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2918769"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3139539"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2571680"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2987840"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.08.040"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3100284"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/10116046\/09795903.pdf?arnumber=9795903","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:51:58Z","timestamp":1685382718000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9795903\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":29,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2022.3182774","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}