{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T16:33:22Z","timestamp":1778690002513,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975431"],"award-info":[{"award-number":["51975431"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52120105008"],"award-info":[{"award-number":["52120105008"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["YWF-22-L-1144"],"award-info":[{"award-number":["YWF-22-L-1144"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tii.2022.3188508","type":"journal-article","created":{"date-parts":[[2022,7,6]],"date-time":"2022-07-06T19:34:11Z","timestamp":1657136051000},"page":"1674-1682","source":"Crossref","is-referenced-by-count":38,"title":["Digital Twin Driven End-Face Defect Control Method for Hot-Rolled Coil With Cloud-Edge Collaboration"],"prefix":"10.1109","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2624-9715","authenticated-orcid":false,"given":"Feng","family":"Xiang","sequence":"first","affiliation":[{"name":"Key Laboratory of Metallurgical Equipment and Control Technology, Ministry of Education, The Hubei Key Laboratory of Mechanical Transmission and Manufacturing Engineering, and Precision Manufacturing Institute, Wuhan University of Science and Technology, Wuhan University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3241-2603","authenticated-orcid":false,"given":"Shun","family":"Zhou","sequence":"additional","affiliation":[{"name":"Key Laboratory of Metallurgical Equipment and Control Technology, Ministry of Education, The Hubei Key Laboratory of Mechanical Transmission and Manufacturing Engineering, and Precision Manufacturing Institute, Wuhan University of Science and Technology, Wuhan University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9067-3932","authenticated-orcid":false,"given":"Ying","family":"Zuo","sequence":"additional","affiliation":[{"name":"Research Institute for Frontier Science, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9020-0633","authenticated-orcid":false,"given":"Fei","family":"Tao","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/03019233.2020.1816806"},{"key":"ref11","first-page":"52","article-title":"Mechanism-intelligent coordination shape control model of cold strip","volume":"52","author":"yang","year":"2017","journal-title":"Iron Steel"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3901\/JME.2017.12.094"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.06.017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3901\/JME.2014.06.039"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2019.104258"},{"key":"ref16","first-page":"68","article-title":"Prediction models of coating mass per unit area for hot-dip galvanized strip based on artificial neural network","volume":"55","author":"qin","year":"2020","journal-title":"Iron Steel"},{"key":"ref17","first-page":"82","article-title":"Data-driven intelligent prediction model of edge seam defects for hot rolling strip","volume":"55","author":"wang","year":"2020","journal-title":"Iron Steel"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2756069"},{"key":"ref19","first-page":"1","article-title":"Five-dimension digital twin model and its ten applications","volume":"25","author":"tao","year":"2019","journal-title":"Comput Integr Manuf Syst"},{"key":"ref4","first-page":"9","article-title":"R-AdaBoost strip steel surface defect feature selection algorithm","volume":"31","author":"liu","year":"2017","journal-title":"J Electron Meas Instrum"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"4972","DOI":"10.1109\/TII.2018.2853676","article-title":"Securing collaborative deep learning in industrial applications within adversarial scenarios","volume":"14","author":"christian","year":"2018","journal-title":"IEEE Trans Ind Informat"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2887145"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2952706"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2963795"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2896357"},{"key":"ref9","first-page":"8032","article-title":"A deep learning-based surface defect inspection system using multiscale and channel-compressed features","volume":"69","author":"yang","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.05.005"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2938885"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101395"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.02.001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2962600"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2018.02.007"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2016.2579198"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.3039226"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/9989328\/09816027.pdf?arnumber=9816027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,16]],"date-time":"2023-01-16T19:19:26Z","timestamp":1673896766000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9816027\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tii.2022.3188508","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}