{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,9]],"date-time":"2026-06-09T11:20:03Z","timestamp":1781004003942,"version":"3.54.1"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T00:00:00Z","timestamp":1682899200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52107160"],"award-info":[{"award-number":["52107160"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61901285"],"award-info":[{"award-number":["61901285"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877142"],"award-info":[{"award-number":["51877142"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51477106"],"award-info":[{"award-number":["51477106"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2023NSFSC0820"],"award-info":[{"award-number":["2023NSFSC0820"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018542","name":"Natural Science Foundation of Sichuan Province","doi-asserted-by":"publisher","award":["2023NSFSC0451"],"award-info":[{"award-number":["2023NSFSC0451"]}],"id":[{"id":"10.13039\/501100018542","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2018SCU12003"],"award-info":[{"award-number":["2018SCU12003"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2021SCU12063"],"award-info":[{"award-number":["2021SCU12063"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Science Foundation of Sichuan Science and Technology Department","award":["2021YFH0119"],"award-info":[{"award-number":["2021YFH0119"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2023,5]]},"DOI":"10.1109\/tii.2022.3197839","type":"journal-article","created":{"date-parts":[[2022,8,10]],"date-time":"2022-08-10T19:31:54Z","timestamp":1660159914000},"page":"6565-6575","source":"Crossref","is-referenced-by-count":52,"title":["Partial Discharge Data Augmentation Based on Improved Wasserstein Generative Adversarial Network With Gradient Penalty"],"prefix":"10.1109","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3790-4014","authenticated-orcid":false,"given":"Guangya","family":"Zhu","sequence":"first","affiliation":[{"name":"High Voltage Laboratory in the College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8109-6408","authenticated-orcid":false,"given":"Kai","family":"Zhou","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory in the College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6077-0977","authenticated-orcid":false,"given":"Lu","family":"Lu","sequence":"additional","affiliation":[{"name":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1126-3650","authenticated-orcid":false,"given":"Yao","family":"Fu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory in the College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8846-8059","authenticated-orcid":false,"given":"Zhaogui","family":"Liu","sequence":"additional","affiliation":[{"name":"High Voltage Laboratory in the College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1094-3841","authenticated-orcid":false,"given":"Xiaomin","family":"Yang","sequence":"additional","affiliation":[{"name":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3023883"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2915685"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.848439"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2021.009662"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.110148"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3080285"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2015.7303259"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2520905"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2384501"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3117288"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3030910"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2908580"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2906086"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2991686"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2014.2345380"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3091504"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2910876"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3053106"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3009159"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref21","article-title":"Data augmentation by pairing samples for images classification","author":"Inoue","year":"2018"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2934901"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2945403"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.10.077"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2017.09.030"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2018.2879750"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3049346"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3008703"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2921803"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.3021789"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.3035620"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3163658"},{"key":"ref33","first-page":"3855","article-title":"Partial discharge data augmentation of high voltage cables based on the variable noise superposition and generative adversarial network","volume-title":"Proc. Int. Conf. Power Syst. Technol.","author":"Wu","year":"2018"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2971319"},{"issue":"4","key":"ref35","first-page":"1505","article-title":"Data augmentation method for power transformer fault diagnosis based on conditional Wasserstein generative adversarial network","volume":"44","author":"Liu","year":"2020","journal-title":"Power System Technol."},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/3460418.3479301"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s00158-022-03253-6"},{"key":"ref38","first-page":"214","article-title":"Wasserstein generative adversarial networks","volume":"70","author":"Arjovsky","year":"2017","journal-title":"Int. Conf. Mach. Learn., PMLR"},{"key":"ref39","article-title":"Improved training of Wasserstein GANs","volume-title":"Adv. Neural Inf. Process. Syst.","author":"Gulrajani","year":"2017"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.07.013"},{"key":"ref41","article-title":"Adam: A method for stochastic optimization","author":"Kingma","year":"2014"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2872043"},{"key":"ref43","article-title":"Adversarial feature learning","author":"Donahue","year":"2016"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2016.08.083"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/10116046\/09854145.pdf?arnumber=9854145","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T00:17:59Z","timestamp":1705018679000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9854145\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5]]},"references-count":44,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2022.3197839","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,5]]}}}