{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T12:02:45Z","timestamp":1784116965511,"version":"3.55.0"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71971181"],"award-info":[{"award-number":["71971181"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72032005"],"award-info":[{"award-number":["72032005"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Research Grant Council of Hong Kong","award":["11203519"],"award-info":[{"award-number":["11203519"]}]},{"name":"Research Grant Council of Hong Kong","award":["11200621"],"award-info":[{"award-number":["11200621"]}]},{"name":"Research Grant Council of Hong Kong","award":["11215119"],"award-info":[{"award-number":["11215119"]}]},{"name":"Hong Kong Innovation and Technology Commission"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tii.2022.3227642","type":"journal-article","created":{"date-parts":[[2022,12,8]],"date-time":"2022-12-08T18:38:27Z","timestamp":1670524707000},"page":"9337-9348","source":"Crossref","is-referenced-by-count":5,"title":["Profile Abstract: An Optimization-Based Subset Selection and Summarization Method for Profile Data Mining"],"prefix":"10.1109","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8227-3501","authenticated-orcid":false,"given":"Feng","family":"Zhu","sequence":"first","affiliation":[{"name":"Department of Advanced Design and Systems Engineering, City University of Hong Kong, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1832-9739","authenticated-orcid":false,"given":"Jianshe","family":"Feng","sequence":"additional","affiliation":[{"name":"CRF Union Digital Technology Co. Ltd., Shenzhen, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8500-8364","authenticated-orcid":false,"given":"Min","family":"Xie","sequence":"additional","affiliation":[{"name":"Department of Advanced Design and Systems Engineering, City University of Hong Kong, Hong Kong"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0990-5119","authenticated-orcid":false,"given":"Lishuai","family":"Li","sequence":"additional","affiliation":[{"name":"School of Data Science, City University of Hong Kong, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2222-3742","authenticated-orcid":false,"given":"Jingzhe","family":"Lei","sequence":"additional","affiliation":[{"name":"Department of Advanced Design and Systems Engineering, City University of Hong Kong, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4022-4274","authenticated-orcid":false,"given":"Jay","family":"Lee","sequence":"additional","affiliation":[{"name":"Center for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2885700"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.02.097"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103503"},{"key":"ref14","article-title":"Generalized feature extraction for structural pattern recognition in time-series data","author":"olszewski","year":"2001"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISCMI.2017.8279589"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1142\/9789812565402_0001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-016-1272-4"},{"key":"ref10","first-page":"1","article-title":"Detecting voids in 3-D printing using melt pool time series data","volume":"33","author":"mahato","year":"2020","journal-title":"J Intell Manuf"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.2012.737745"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1115\/1.4043731"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2300753"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2981382"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108709"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2977456"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3161602"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/wics.1392"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2904889"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2511748"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC49169.2020.9185395"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2696534"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2013.11.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.05.012"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3166\/ejc.13.242-260"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2020.113836"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2006.12.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.3037085"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2983061"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2018.08.038"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2800014"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107938"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2018.1508275"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2020.3046044"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/10192510\/09976250.pdf?arnumber=9976250","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T18:09:32Z","timestamp":1692036572000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9976250\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":32,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tii.2022.3227642","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}