{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,2]],"date-time":"2026-08-02T18:37:00Z","timestamp":1785695820875,"version":"3.56.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,1]],"date-time":"2023-11-01T00:00:00Z","timestamp":1698796800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2021GCRC058"],"award-info":[{"award-number":["2021GCRC058"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1109\/tii.2023.3241579","type":"journal-article","created":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T19:31:12Z","timestamp":1675279872000},"page":"10674-10683","source":"Crossref","is-referenced-by-count":125,"title":["Collaborative Discrepancy Optimization for Reliable Image Anomaly Localization"],"prefix":"10.1109","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7619-6618","authenticated-orcid":false,"given":"Yunkang","family":"Cao","sequence":"first","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaohao","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0350-9035","authenticated-orcid":false,"given":"Zhaoge","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5204-7992","authenticated-orcid":false,"given":"Weiming","family":"Shen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5220\/0010865000003124"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2019.2958826"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-020-01400-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/cim2.12047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108815"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/wacv48630.2021.00195"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/wacv51458.2022.00188"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3094452"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-68799-1_35"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr46437.2021.00283"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-69544-6_23"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107706"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1016\/j.neucom.2020.11.018","article-title":"DFR: Deep feature reconstruction for unsupervised anomaly segmentation","volume":"424","author":"Shi","year":"2021","journal-title":"Neurocomputing"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/iccv48922.2021.00822"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3142326"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00179"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.5220\/0007364500002108"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr46437.2021.01466"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr42600.2020.00424"},{"key":"ref20","first-page":"306","article-title":"Student-teacher feature pyramid matching for anomaly detection","volume-title":"Proc. Brit. Mach. Vis. Conf.","author":"Wang"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.108846"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00951"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CSCWD54268.2022.9776026"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2018.2858826"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/cvprw.2009.5206848"},{"key":"ref26","first-page":"1","article-title":"Decoupled weight decay regularization","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Loshchilov"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2020.2983686"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/WACV56688.2023.00264"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.90"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.5244\/C.30.87"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/10255543\/10034849.pdf?arnumber=10034849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T05:39:35Z","timestamp":1710394775000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10034849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11]]},"references-count":30,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tii.2023.3241579","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,11]]}}}