{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T15:00:50Z","timestamp":1778166050376,"version":"3.51.4"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71901138"],"award-info":[{"award-number":["71901138"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72271154"],"award-info":[{"award-number":["72271154"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12171432"],"award-info":[{"award-number":["12171432"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72371008"],"award-info":[{"award-number":["72371008"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71971009"],"award-info":[{"award-number":["71971009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tii.2023.3313668","type":"journal-article","created":{"date-parts":[[2023,9,19]],"date-time":"2023-09-19T18:35:13Z","timestamp":1695148513000},"page":"3675-3684","source":"Crossref","is-referenced-by-count":13,"title":["Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales"],"prefix":"10.1109","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6549-6906","authenticated-orcid":false,"given":"Qingqing","family":"Zhai","sequence":"first","affiliation":[{"name":"School of Management, Shanghai University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3289-2720","authenticated-orcid":false,"given":"Ancha","family":"Xu","sequence":"additional","affiliation":[{"name":"Department of Statistics, Collaborative Innovation Center of Statistical Data Engineering, Technology & Application, Zhejiang Gongshang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1428-0280","authenticated-orcid":false,"given":"Jun","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-0678-7797","authenticated-orcid":false,"given":"Yijing","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Management, Shanghai University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2810284"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3202642"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2918734"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3066257"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2020.1768455"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2021.107820"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEM.2019.2905004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2017.1375994"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2813964"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-020-3134-8"},{"key":"ref12","article-title":"Wiener degradation models with scale-mixture normal distributed measurement errors for RUL prediction","volume-title":"Mech. Syst. Signal Process.","volume":"173","author":"Ge","year":"2022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2419220"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.06.029"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2021.10.049"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907440"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108531"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2021.3097311"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108986"},{"issue":"10","key":"ref20","first-page":"1789","article-title":"Degradation modeling and remaining useful life prediction with bivariate time scale","volume":"43","author":"Zhang","year":"2017","journal-title":"Zidonghua Xuebao\/Acta Automatica Sinica"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2951804"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-62226-2"},{"key":"ref23","volume-title":"Introduction to Probability Models","author":"Ross","year":"2014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2513038"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1239\/aap\/1324045702"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1137\/151006172"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-84876-1_1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2022.2157881"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2014.915891"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107877"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/10460266\/10255293.pdf?arnumber=10255293","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T02:14:23Z","timestamp":1709864063000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10255293\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tii.2023.3313668","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}