{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T16:06:56Z","timestamp":1778083616244,"version":"3.51.4"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2020AAA0109200"],"award-info":[{"award-number":["2020AAA0109200"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/tii.2024.3435539","type":"journal-article","created":{"date-parts":[[2024,8,13]],"date-time":"2024-08-13T17:47:28Z","timestamp":1723571248000},"page":"13373-13383","source":"Crossref","is-referenced-by-count":6,"title":["Elite Gene Transfer Learning Heuristic Algorithm in Scheduling Aircraft Assembly"],"prefix":"10.1109","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-4091-1098","authenticated-orcid":false,"given":"Kai","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9736-6583","authenticated-orcid":false,"given":"Yingwei","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Laboratory of Synthesis Automation of Process Industry, Northeastern University, Shenyang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3713-7962","authenticated-orcid":false,"given":"Hongrui","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8145-7883","authenticated-orcid":false,"given":"Zhuming","family":"Bi","sequence":"additional","affiliation":[{"name":"Department of Civil and Mechanical Engineering, Purdue University Fort Wayne, Fort Wayne, IN, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1257\/aer.90.4.1034"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2022.3211247"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2021.102154"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3220860"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10799-015-0223-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2023.109436"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3234618"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3266278"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.10.004"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.05.011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101839"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.03.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CEC45853.2021.9504912"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2021.3079843"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2969689"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2017.2771451"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3222772"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2022.3229666"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3189725"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.swevo.2023.101387"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2023.110801"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.swevo.2023.101335"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3272661"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2316193"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2023.3239953"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.07.003"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/math11030522"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2016.12.011"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2019.8929234"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3252820"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3005047"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2023.119141"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13020324"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0045-7825(99)00389-8"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3390\/a17010009"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2021.3131236"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.2019.8790143"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2023.111257"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-54910-3"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/10745137\/10634977.pdf?arnumber=10634977","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T14:47:05Z","timestamp":1732718825000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10634977\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":39,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tii.2024.3435539","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}