{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T16:24:22Z","timestamp":1775579062691,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFC2203904"],"award-info":[{"award-number":["2022YFC2203904"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Key Laboratory of Extreme Photonics and Instrumentation Innovation Program","award":["EPI2023ZD01"],"award-info":[{"award-number":["EPI2023ZD01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tii.2024.3514164","type":"journal-article","created":{"date-parts":[[2025,1,6]],"date-time":"2025-01-06T20:02:10Z","timestamp":1736193730000},"page":"2927-2936","source":"Crossref","is-referenced-by-count":2,"title":["LASER: LAyered ScenE Recognition for Visual Intelligent Recycling of Steel Scrap"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-7438-0214","authenticated-orcid":false,"given":"Jiarui","family":"Lei","sequence":"first","affiliation":[{"name":"State Key Laboratory of Extreme Photonics and Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-4110-2888","authenticated-orcid":false,"given":"Sheng","family":"Huang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Extreme Photonics and Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5697-790X","authenticated-orcid":false,"given":"Zheqiang","family":"Shen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Extreme Photonics and Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lan","family":"Wu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Extreme Photonics and Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2463-832X","authenticated-orcid":false,"given":"Dong","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Extreme Photonics and Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.joule.2021.02.018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2887145"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3284930"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3313641"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/12.2627407"},{"key":"ref6","first-page":"1","article-title":"Research on scrap steel evaluation technology based on faster-RCNN","volume-title":"Proc. Int. Conf. Mach. Learn. Comput. Appl.","author":"Qin","year":"2021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.106241"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3206816"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/s41597-023-02662-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1137\/0916069"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/10671315.1978.10615524"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/BF02591962"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/11612032_92"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2023.109384"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref16","first-page":"8748","article-title":"Learning transferable visual models from natural language supervision","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Radford","year":"2021"},{"key":"ref17","first-page":"35631","article-title":"Learning mask-aware clip representations for zero-shot segmentation","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Jiao","year":"2023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00830"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref20","first-page":"6105","article-title":"Efficientnet: Rethinking model scaling for convolutional neural networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Tan","year":"2019"},{"issue":"11","key":"ref21","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1117\/1.AP.5.6.066004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1186\/s43074-023-00095-3"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1186\/s43074-024-00136-5"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1186\/s43074-022-00051-7"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/10949153\/10829384.pdf?arnumber=10829384","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T22:25:11Z","timestamp":1744064711000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10829384\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":25,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tii.2024.3514164","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}