{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T02:03:18Z","timestamp":1776132198089,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473173"],"award-info":[{"award-number":["62473173"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973135"],"award-info":[{"award-number":["61973135"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Young Taishan Scholars Program of Shandong Province of China","award":["tsqn202408206"],"award-info":[{"award-number":["tsqn202408206"]}]},{"name":"Project of Shandong Province Higher Educational Youth and Innovation Talent Introduction and Education Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tii.2024.3523593","type":"journal-article","created":{"date-parts":[[2025,1,8]],"date-time":"2025-01-08T15:49:13Z","timestamp":1736351353000},"page":"3346-3355","source":"Crossref","is-referenced-by-count":8,"title":["Track Defect Detection Based on Improved YOLOv5s"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-7265-5228","authenticated-orcid":false,"given":"Qinjun","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, University of Jinan, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5439-2367","authenticated-orcid":false,"given":"Shanchang","family":"Fang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, University of Jinan, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1614-0302","authenticated-orcid":false,"given":"Yueyang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, University of Jinan, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6672-262X","authenticated-orcid":false,"given":"Hongwei","family":"Shang","sequence":"additional","affiliation":[{"name":"Hefei Chaoke Electronics Co., Ltd., Hefei, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0258-3254","authenticated-orcid":false,"given":"Han","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, University of Jinan, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6280-7091","authenticated-orcid":false,"given":"Tao","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, University of Jinan, Jinan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-est.2020.0041"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2987840"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3026272"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2243743"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2021.103596"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2021.124337"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.csite.2021.101234"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s20185220"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s22249970"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1177\/09544097241234380"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1177\/14759217211013110"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2020.101206"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111690"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2984264"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1061\/AJRUA6.0001024"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/sym13071176"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s20051459"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101825"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-020-09934-2"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2021.3101053"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3000506"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2022.108269"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/s23187894"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2024.3391899"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA48937.2020.9248299"},{"key":"ref26","article-title":"DHA: Learning decoupled-head attention from transformer checkpoints via adaptive heads fusion","author":"Chen","year":"2024"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3264441"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/f14091885"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/10949153\/10834396.pdf?arnumber=10834396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T18:13:58Z","timestamp":1762539238000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10834396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":28,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tii.2024.3523593","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}