{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T20:21:15Z","timestamp":1776198075405,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62373128"],"award-info":[{"award-number":["62373128"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62203143"],"award-info":[{"award-number":["62203143"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/tii.2025.3563521","type":"journal-article","created":{"date-parts":[[2025,5,13]],"date-time":"2025-05-13T13:49:46Z","timestamp":1747144186000},"page":"6188-6197","source":"Crossref","is-referenced-by-count":4,"title":["A DTW-Gaussian Spatiotemporal Self-Attention Network and Its Application in Industrial Fault Diagnosis With Unequal-Length Sensor Data"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0053-278X","authenticated-orcid":false,"given":"Hewei","family":"Gao","sequence":"first","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4945-6271","authenticated-orcid":false,"given":"Xin","family":"Huo","sequence":"additional","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3918-7039","authenticated-orcid":false,"given":"Yuchen","family":"Jiang","sequence":"additional","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chao","family":"Zhu","sequence":"additional","affiliation":[{"name":"Intelligent Algorithm Technology Section, Shanghai Rising Digital Company Ltd., Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0506-8632","authenticated-orcid":false,"given":"Changchun","family":"He","sequence":"additional","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3009564"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC57536.2023.10121105"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2023.3326865"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3345631"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEM.2022.3182380"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3519370"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3318690"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2018.2836349"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3151399"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-018-3287-6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3188839"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2607683"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3223347"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2020.105484"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPE-ST51904.2022.9757105"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00357"},{"key":"ref17","article-title":"Out-of-distribution representation learning for time series classification","author":"Lu","year":"2023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3227540"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SII55687.2023.10039230"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/Confluence52989.2022.9734175"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3269115"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2993842"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2023.3269219"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3384603"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICEEAC61226.2024.10576278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-020-01859-1"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.dib.2018.11.019"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3103412"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2025.3538064"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2023.3245334"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11077778\/11002743.pdf?arnumber=11002743","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T17:47:45Z","timestamp":1752256065000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11002743\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":30,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tii.2025.3563521","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}