{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T01:25:08Z","timestamp":1768008308319,"version":"3.49.0"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/tii.2025.3563526","type":"journal-article","created":{"date-parts":[[2025,5,12]],"date-time":"2025-05-12T13:46:33Z","timestamp":1747057593000},"page":"6220-6229","source":"Crossref","is-referenced-by-count":1,"title":["A High-Accuracy and Faster Face Recognizer Supporting Biometric Continuous Authentication for Smart Factory Workers"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1553-7631","authenticated-orcid":false,"given":"Adri","family":"Priadana","sequence":"first","affiliation":[{"name":"Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6184-4133","authenticated-orcid":false,"given":"Duy-Linh","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7411-0697","authenticated-orcid":false,"given":"Xuan-Thuy","family":"Vo","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1785-1018","authenticated-orcid":false,"given":"Muhamad Dwisnanto","family":"Putro","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Sam Ratulangi University, Manado, Indonesia"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9135-3888","authenticated-orcid":false,"given":"Ge","family":"Cao","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4937-7082","authenticated-orcid":false,"given":"Kang-Hyun","family":"Jo","sequence":"additional","affiliation":[{"name":"Department of Electrical, Electronic and Computer Engineering, University of Ulsan, Ulsan, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2916622"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3274224"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3182326"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2023.3239611"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3171321"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3219135"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3178376"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2018.07.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107704"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3087709"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01819"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3008012"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-021-09974-2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR56361.2022.9955645"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HSI49210.2020.9142636"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3022501"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3138752"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3145862"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3296921"},{"key":"ref20","first-page":"1","article-title":"Labeled faces in the wild: A database forstudying face recognition in unconstrained environments","volume-title":"Proc. Workshop Faces in\u2019Real-Life\u2019Images: Detection, Alignment, Recognit.","author":"Huang","year":"2008"},{"key":"ref21","article-title":"Cross-age LFW: A database for studying cross-age face recognition in unconstrained environments","author":"Zheng","year":"2017"},{"key":"ref22","article-title":"Cross-pose LFW: A database for studying cross-pose face recognition in unconstrained environments","volume":"18","author":"Zheng","year":"2018"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2016.7477558"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2017.250"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-49071-2_4"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3037451"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/s22114219"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/s21134520"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2022.103628"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.01157"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.5555\/3045118.3045167"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2017.12.012"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3047209"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2913372"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11077778\/11000103.pdf?arnumber=11000103","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T17:47:23Z","timestamp":1752256043000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11000103\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":37,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tii.2025.3563526","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}