{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T00:11:18Z","timestamp":1760832678045,"version":"build-2065373602"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tii.2025.3586034","type":"journal-article","created":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T18:46:38Z","timestamp":1753296398000},"page":"8638-8649","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Burst Mode Control Algorithm for SE-IH Applications to Reduce Switch Current Spikes With Improved System Reliability and Power Conversion Efficiency"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-9555-1857","authenticated-orcid":false,"given":"Aneel","family":"Ahmed","sequence":"first","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0502-4752","authenticated-orcid":false,"given":"Sang-Wook","family":"Ryu","sequence":"additional","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1256-1281","authenticated-orcid":false,"given":"Hyunghu","family":"Park","sequence":"additional","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2771-4615","authenticated-orcid":false,"given":"Irfan","family":"Ali","sequence":"additional","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4637-4334","authenticated-orcid":false,"given":"Zawar","family":"Khan","sequence":"additional","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3429-5049","authenticated-orcid":false,"given":"Jin-Woo","family":"Jung","sequence":"additional","affiliation":[{"name":"Division of Electronics and Electrical Engineering, Dongguk University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2891107"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3003335"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2281162"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3201355"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2294136"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2226184"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2239302"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3175979"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2755367"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0537"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2004037"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/28.703961"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/epe.2013.6631837"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2011.6119711"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2281164"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EEEIC.2013.6549590"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2019.8872026"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/28.491475"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/28.767013"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2049706"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/epe.2015.7309110"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2050752"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3013756"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2022516"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2793270"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3226497"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3118434"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3173633"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5637246"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12194145"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11206732\/11091603.pdf?arnumber=11091603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,18]],"date-time":"2025-10-18T04:55:06Z","timestamp":1760763306000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11091603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":30,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tii.2025.3586034","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"type":"print","value":"1551-3203"},{"type":"electronic","value":"1941-0050"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}