{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T19:28:05Z","timestamp":1771702085651,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62325304"],"award-info":[{"award-number":["62325304"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22B2046"],"award-info":[{"award-number":["U22B2046"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U24A20279"],"award-info":[{"award-number":["U24A20279"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Jiangsu Provincial Scientific Research Center of Applied Mathematics","award":["BK20233002"],"award-info":[{"award-number":["BK20233002"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tii.2025.3598521","type":"journal-article","created":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T17:44:54Z","timestamp":1756489494000},"page":"9608-9618","source":"Crossref","is-referenced-by-count":1,"title":["Distributed Robust State Estimation for Islanded Microgrids With Randomly Occurring Measurement Outliers"],"prefix":"10.1109","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-1291-5046","authenticated-orcid":false,"given":"Aiqi","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Automation, Beijing Institute of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5069-7091","authenticated-orcid":false,"given":"Xingquan","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Cyber Science and Engineering, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-3268-2737","authenticated-orcid":false,"given":"Zhitao","family":"Fan","sequence":"additional","affiliation":[{"name":"School of Automation, Beijing Institute of Technology, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0070-8597","authenticated-orcid":false,"given":"Guanghui","family":"Wen","sequence":"additional","affiliation":[{"name":"School of Automation, Southeast University, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.08.108"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3417248"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2024.3405711"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2025.3550178"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2012.2187037"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2019.02.070"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2194969"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2020.9097534"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3119949"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3394553"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2905295"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2012.2236647"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2777495"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2782750"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2902793"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2006.1657817"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/EUSIPCO.2019.8903118"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2012.2228281"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3246465"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2013.6638770"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2017.2651684"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2019.2916755"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2020.1817614"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2008.929620"},{"key":"ref25","article-title":"Variational algorithms for approximate Bayesian inference","author":"Beal","year":"2003"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2381093"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3042944"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/9781118524336"},{"key":"ref30","article-title":"Conjugate Bayesian analysis of the Gaussian distribution","author":"Murphy","year":"2007"},{"key":"ref31","volume-title":"Kendalls Advanced Theory of Statistics: Bayesian Inference","author":"OHagan","year":"2004"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2015.2493979"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2208106"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11230187\/11145246.pdf?arnumber=11145246","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T18:14:15Z","timestamp":1762539255000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11145246\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":33,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tii.2025.3598521","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}