{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T06:59:02Z","timestamp":1772780342861,"version":"3.50.1"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004351","name":"Sultan Qaboos University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004351","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tii.2025.3639486","type":"journal-article","created":{"date-parts":[[2025,12,12]],"date-time":"2025-12-12T18:38:38Z","timestamp":1765564718000},"page":"2311-2322","source":"Crossref","is-referenced-by-count":5,"title":["Efficient Fault Diagnosis in Industrial Systems Using Enhanced PolyKAN Techniques"],"prefix":"10.1109","volume":"22","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6390-4304","authenticated-orcid":false,"given":"Majdi","family":"Mansouri","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Khadija","family":"Attouri","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdelmalek","family":"Kouadri","sequence":"additional","affiliation":[{"name":"Signals and Systems Laboratory, Institute of Electrical and Electronics Engineering, University M’Hamed Bougara of Boumerdes, Boumerdes, Algeria"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3116937"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3293865"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3443252"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.47836\/pjst.30.1.04"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2025.3529797"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-08017-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-022-01841-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/computers14030093"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3150888"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3440486"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2021.107721"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2013.2260421"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/OPTIM.2017.7974974"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3430010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3110947"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-019-04454-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3175866"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984443"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/su15043191"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-023-08957-4"},{"key":"ref21","article-title":"KAT to KANs: A review of KolmogorovArnold networks and the neural leap forward","author":"Basina","year":"2024"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-88054-9"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/j8030024"},{"key":"ref24","article-title":"A comprehensive survey on KolmogorovArnold networks (KAN)","author":"Ji","year":"2024"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3504962"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1103\/physrevresearch.7.023037"},{"issue":"2","key":"ref27","doi-asserted-by":"crossref","DOI":"10.1145\/3743128","article-title":"A survey on KolmogorovArnold network","volume":"58","author":"Somvanshi","year":"2024","journal-title":"ACM Comput. Surveys"},{"key":"ref28","article-title":"Function fitting based on KolmogorovArnold theorem and kernel functions","author":"Liu","year":"2025"},{"issue":"1","key":"ref29","first-page":"45","article-title":"A hybrid machine learning and physics-based approach for accurate energy consumption modeling of electric buses in public transport","volume":"268","author":"Adam","year":"2025","journal-title":"Sensors Transducers"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/OAJPE.2025.3529928"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3528940"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/sym16040455"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.istruc.2021.09.069"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/s24248157"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.05.098"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-444-63428-3.50190-9"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2022.132925"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3390\/s24020565"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12020409"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3088237"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2025.3591578"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2013.07.039"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2020.104091"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2025.126975"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3507876"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3354926"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2023.103143"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s42979-022-01409-1"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1186\/s44147-023-00227-3"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11421872\/11299374.pdf?arnumber=11299374","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T05:44:51Z","timestamp":1772775891000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11299374\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":49,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tii.2025.3639486","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}