{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,8]],"date-time":"2026-06-08T20:07:34Z","timestamp":1780949254756,"version":"3.54.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473154"],"award-info":[{"award-number":["62473154"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473155"],"award-info":[{"award-number":["62473155"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473156"],"award-info":[{"award-number":["62473156"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Chenguang","award":["21CGA37"],"award-info":[{"award-number":["21CGA37"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tii.2026.3667392","type":"journal-article","created":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T19:57:01Z","timestamp":1773431821000},"page":"4932-4943","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Self-Supervised Orthogonal Decoupling Autoencoder for Industrial Process Sensor Fault Detection and Diagnosis"],"prefix":"10.1109","volume":"22","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-0528-470X","authenticated-orcid":false,"given":"Hongyu","family":"Tian","sequence":"first","affiliation":[{"name":"Key Laboratory of Advanced Control and Optimization for Chemical Processes of the Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9400-1415","authenticated-orcid":false,"given":"Hongbo","family":"Shi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Control and Optimization for Chemical Processes of the Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0454-899X","authenticated-orcid":false,"given":"Li","family":"Wang","sequence":"additional","affiliation":[{"name":"Faculty of Intelligence Technology, Shanghai Institute of Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1379-245X","authenticated-orcid":false,"given":"Bing","family":"Song","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Control and Optimization for Chemical Processes of the Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5058-8899","authenticated-orcid":false,"given":"Yang","family":"Tao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Control and Optimization for Chemical Processes of the Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuguo","family":"Yang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Advanced Control and Optimization for Chemical Processes of the Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.02.017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3315352"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2004.06.009"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-023-08561-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2020.111990"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(90)90018-D"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3063838"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3241680"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3411471"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2658732"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2853603"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2771226"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2024.11.086"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2022.107884"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2024.3360030"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2991693"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2897946"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3394486.3403392"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690410711"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2024.07.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.06.017"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2020.06.001"},{"key":"ref23","first-page":"3570","article-title":"On orthogonality and learning recurrent networks with long term dependencies","volume-title":"Proc. Int. Conf. Mach. Learn.","volume":"70","author":"Vorontsov","year":"2017"},{"key":"ref24","article-title":"beta-VAE: Learning basic visual concepts with a constrained variational framework","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Higgins","year":"2017"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2025.107156"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/ie102564d"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2466557"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref29","article-title":"Unsupervised and supervised principal component analysis: Tutorial","author":"Ghojogh","year":"2022"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1515\/9781400830244"},{"key":"ref31","first-page":"10524","article-title":"On layer normalization in the transformer architecture","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Xiong","year":"2020"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682012"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.08.199"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CySWater.2016.7469060"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3055366.3055375"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/9424\/11552842\/11434536.pdf?arnumber=11434536","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,8]],"date-time":"2026-06-08T19:55:53Z","timestamp":1780948553000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11434536\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":35,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tii.2026.3667392","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}