{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,20]],"date-time":"2025-03-20T07:10:35Z","timestamp":1742454635375,"version":"3.40.1"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2002,6,1]],"date-time":"2002-06-01T00:00:00Z","timestamp":1022889600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2002,6]]},"DOI":"10.1109\/tim.2002.1017708","type":"journal-article","created":{"date-parts":[[2002,11,7]],"date-time":"2002-11-07T19:41:04Z","timestamp":1036698064000},"page":"408-412","source":"Crossref","is-referenced-by-count":6,"title":["An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band"],"prefix":"10.1109","volume":"51","author":[{"given":"S.A.","family":"Chahine","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Huyart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Bergeault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.P.","family":"Jallet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1976.1123701"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1995.406149"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EUMA.1995.336975"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.199442"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.1994.333395"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/BF02995687"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.278612"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.119790"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1978.1129527"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1979.1129778"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/21898\/01017708.pdf?arnumber=1017708","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,20]],"date-time":"2025-03-20T06:35:06Z","timestamp":1742452506000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1017708\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,6]]},"references-count":10,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2002,6]]}},"URL":"https:\/\/doi.org\/10.1109\/tim.2002.1017708","relation":{},"ISSN":["0018-9456"],"issn-type":[{"type":"print","value":"0018-9456"}],"subject":[],"published":{"date-parts":[[2002,6]]}}}