{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T23:51:05Z","timestamp":1780617065376,"version":"3.54.1"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2009,3,1]],"date-time":"2009-03-01T00:00:00Z","timestamp":1235865600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/tim.2008.2005820","type":"journal-article","created":{"date-parts":[[2008,10,7]],"date-time":"2008-10-07T19:33:58Z","timestamp":1223408038000},"page":"698-706","source":"Crossref","is-referenced-by-count":13,"title":["Stand-Alone Surface Roughness Analyzer"],"prefix":"10.1109","volume":"58","author":[{"given":"S.","family":"Moslehpour","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C.","family":"Campana","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"D.","family":"Shetty","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"B.","family":"Deryniosky","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","year":"1993","journal-title":"Method and apparatus for surface roughness measurement using laser diffraction pattern"},{"key":"ref11","first-page":"24","article-title":"laser-based tool maps surface roughness","volume":"40","author":"adams","year":"2001","journal-title":"Quality"},{"key":"ref12","author":"beckmann","year":"1963","journal-title":"The Scattering of Electromagnetic Waves from Rough Surfaces"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1117\/3.203079.ch2"},{"key":"ref14","author":"bennet","year":"1993","journal-title":"Introduction to Surface Roughness and Scattering"},{"key":"ref15","first-page":"597","article-title":"methodology and modeling of a laser based in-process surface finish inspection probe","author":"shetty","year":"1997","journal-title":"Proc 32nd Int MATADOR Conf"},{"key":"ref16","first-page":"555","article-title":"intelligent decision making based on on-line non contact measurement during machining process","volume":"8","author":"shetty","year":"1998","journal-title":"Proc ASME IMECE"},{"key":"ref17","year":"0"},{"key":"ref18","year":"0","journal-title":"DSPIC30F Family Overview"},{"key":"ref19","year":"0","journal-title":"DSPIC30F Reference Manual"},{"key":"ref4","author":"bennet","year":"1993","journal-title":"Introduction to Surface Roughness and Scattering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/3.203079.ch2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1115\/1.3185908"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1115\/1.3184477"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SFICON.2004.1287129"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0043-1648(86)90247-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-0136(02)00731-8"},{"key":"ref1","first-page":"1537","article-title":"measuring surface finish using machine vision","author":"jetley","year":"1992","journal-title":"Proc ASEE Annu Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/AO.29.003613"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/4777660\/04639483.pdf?arnumber=4639483","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:50Z","timestamp":1633910390000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4639483\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":19,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tim.2008.2005820","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,3]]}}}