{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:08:35Z","timestamp":1766268515943},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2009,4,1]],"date-time":"2009-04-01T00:00:00Z","timestamp":1238544000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,4]]},"DOI":"10.1109\/tim.2008.2006963","type":"journal-article","created":{"date-parts":[[2008,12,3]],"date-time":"2008-12-03T20:47:59Z","timestamp":1228337279000},"page":"791-796","source":"Crossref","is-referenced-by-count":43,"title":["Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability"],"prefix":"10.1109","volume":"58","author":[{"given":"B.","family":"Jeanneret","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Overney","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Callegaro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Mortara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Rufenacht","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007041"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891156"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.122064"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891076"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.2901683"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891092"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008087"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/18\/11\/008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/8\/305"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.918132"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.769583"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843084"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/77.783938"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1140\/epjst\/e2009-01050-6"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.377816"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.917260"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/4799271\/04674627.pdf?arnumber=4674627","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:00:44Z","timestamp":1633910444000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4674627\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,4]]},"references-count":16,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2008.2006963","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,4]]}}}