{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T23:22:44Z","timestamp":1775344964977,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2009,8,1]],"date-time":"2009-08-01T00:00:00Z","timestamp":1249084800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,8]]},"DOI":"10.1109\/tim.2009.2016302","type":"journal-article","created":{"date-parts":[[2009,5,4]],"date-time":"2009-05-04T19:33:43Z","timestamp":1241465623000},"page":"2807-2814","source":"Crossref","is-referenced-by-count":27,"title":["Characterization of the Accommodation Effect in Soft Hysteretic Materials Via Sensorless Measurement Technique"],"prefix":"10.1109","volume":"58","author":[{"given":"B.","family":"Tellini","sequence":"first","affiliation":[]},{"given":"R.","family":"Giannetti","sequence":"additional","affiliation":[]},{"given":"S.","family":"Lizon-Martinez","sequence":"additional","affiliation":[]},{"given":"M.","family":"Marracci","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.814689"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.769682"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.310174"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.814684"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.917200"},{"key":"ref15","author":"mayergoyz","year":"0"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.328886"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/20.538908"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/20.281262"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2005.854335"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/20.334092"},{"key":"ref8","year":"1992","journal-title":"IEEE Standard for Test Procedures for Magnetic Cores"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.physb.2007.08.080"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1051\/jphysrad:01959002002-3021500"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1051\/jphysrad:01959002002-3022200"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.836327"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5159565\/04907154.pdf?arnumber=4907154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:01:50Z","timestamp":1633910510000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4907154\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,8]]},"references-count":16,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2016302","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,8]]}}}