{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,4]],"date-time":"2025-10-04T08:13:03Z","timestamp":1759565583869},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2009,9,1]],"date-time":"2009-09-01T00:00:00Z","timestamp":1251763200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,9]]},"DOI":"10.1109\/tim.2009.2017170","type":"journal-article","created":{"date-parts":[[2009,7,30]],"date-time":"2009-07-30T14:46:38Z","timestamp":1248965198000},"page":"3238-3244","source":"Crossref","is-referenced-by-count":23,"title":["Determination of the Complex Residual Error Parameters of a Calibrated One-Port Vector Network Analyzer"],"prefix":"10.1109","volume":"58","author":[{"given":"G.","family":"Wubbeler","sequence":"first","affiliation":[]},{"given":"C.","family":"Elster","sequence":"additional","affiliation":[]},{"given":"T.","family":"Reichel","sequence":"additional","affiliation":[]},{"given":"R.","family":"Judaschke","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","year":"2006","journal-title":"Method for measuring the residual system directivity and\/or the residual system port impedance match of a system-calibrated vector network analyser"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1984.323576"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/24\/1\/003"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2007.5456312"},{"key":"ref5","first-page":"218","author":"reichel","year":"2006","journal-title":"Neue Innovative Kalibrierverfahren im Nieder-und Hochfrequenzbereich"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1975.9792"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.278614"},{"key":"ref2","author":"persson","year":"2002","journal-title":"An algorithm for the evaluation of the residual directivity ripple trace"},{"key":"ref9","year":"0","journal-title":"Matlab"},{"key":"ref1","year":"2000","journal-title":"Guidelines for the Evaluation of Vector Network Analysers (VNA)"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5200743\/05175350.pdf?arnumber=5175350","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:01:20Z","timestamp":1633910480000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5175350\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,9]]},"references-count":10,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2017170","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,9]]}}}